These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

126 related articles for article (PubMed ID: 35910113)

  • 1. Interfacial Delamination at Multilayer Thin Films in Semiconductor Devices.
    Kim JH; Kil HJ; Lee S; Park J; Park JW
    ACS Omega; 2022 Jul; 7(29):25219-25228. PubMed ID: 35910113
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Thermal expansion coefficient and thermomechanical properties of SiN(x) thin films prepared by plasma-enhanced chemical vapor deposition.
    Tien CL; Lin TW
    Appl Opt; 2012 Oct; 51(30):7229-35. PubMed ID: 23089776
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Detailed modelling of delamination buckling of thin films under global tension.
    Toth F; Rammerstorfer FG; Cordill MJ; Fischer FD
    Acta Mater; 2013 Apr; 61(7):2425-2433. PubMed ID: 23555179
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Accurate prediction of multilayered residual stress in fabricating a mid-infrared long-wave pass filter with interfacial stress measurements.
    Tien CL; Lin HY
    Opt Express; 2020 Nov; 28(24):36994-37003. PubMed ID: 33379781
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Review Paper: Residual Stresses in Deposited Thin-Film Material Layers for Micro- and Nano-Systems Manufacturing.
    Huff M
    Micromachines (Basel); 2022 Nov; 13(12):. PubMed ID: 36557383
    [TBL] [Abstract][Full Text] [Related]  

  • 6. The macroscopic delamination of thin films from elastic substrates.
    Vella D; Bico J; Boudaoud A; Roman B; Reis PM
    Proc Natl Acad Sci U S A; 2009 Jul; 106(27):10901-6. PubMed ID: 19556551
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Effects of the Manufacturing Process on the Reliability of the Multilayer Structure in MetalMUMPs Actuators: Residual Stresses and Variation of Design Parameters.
    Guo J; Wang J; Zeng S; Silberschmidt VV; Shen Y
    Micromachines (Basel); 2017 Nov; 8(12):. PubMed ID: 30400537
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Theoretical Study on Synchronous Characterization of Surface and Interfacial Mechanical Properties of Thin-Film/Substrate Systems with Residual Stress Based on Pressure Blister Test Technique.
    Yang ZX; Sun JY; Li K; Lian YS; He XT; Zheng ZL
    Polymers (Basel); 2018 Jan; 10(1):. PubMed ID: 30966085
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Microstructure and Fracture Behavior of Special Multilayered Steel.
    Zhou X; Zhao X; Cao R; Zhang R; Ding Y; Zhang X
    Materials (Basel); 2020 Feb; 13(3):. PubMed ID: 32050473
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Thin-Film Engineering of Mechanical Fragmentation Properties of Atomic-Layer-Deposited Metal Oxides.
    Ruoho M; Niemelä JP; Guerra-Nunez C; Tarasiuk N; Robertson G; Taylor AA; Maeder X; Kapusta C; Michler J; Utke I
    Nanomaterials (Basel); 2020 Mar; 10(3):. PubMed ID: 32204547
    [TBL] [Abstract][Full Text] [Related]  

  • 11. FEM Modeling of In-Plane Stress Distribution in Thick Brittle Coatings/Films on Ductile Substrates Subjected to Tensile Stress to Determine Interfacial Strength.
    Wang K; Zhang F; Bordia RK
    Materials (Basel); 2018 Mar; 11(4):. PubMed ID: 29584647
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Plasma-Enhanced Atomic Layer Deposition of HfO
    Beladiya V; Faraz T; Schmitt P; Munser AS; Schröder S; Riese S; Mühlig C; Schachtler D; Steger F; Botha R; Otto F; Fritz T; van Helvoirt C; Kessels WMM; Gargouri H; Szeghalmi A
    ACS Appl Mater Interfaces; 2022 Mar; 14(12):14677-14692. PubMed ID: 35311275
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Microstructural Effects on the Interfacial Adhesion of Nanometer-Thick Cu Films on Glass Substrates: Implications for Microelectronic Devices.
    Lassnig A; Terziyska VL; Zalesak J; Jörg T; Toebbens DM; Griesser T; Mitterer C; Pippan R; Cordill MJ
    ACS Appl Nano Mater; 2021 Jan; 4(1):61-70. PubMed ID: 33521588
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Shear Failure in Supported Two-Dimensional Nanosheet Van der Waals Thin Films.
    Castilho CJ; Li D; Xie Y; Gao H; Hurt RH
    Carbon N Y; 2021 Mar; 173():410-418. PubMed ID: 33223559
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Curvature-controlled delamination patterns of thin films on spherical substrates.
    Zhu L; Yuan H; Wu K; Wang X; Liu G; Sun J; Liao X; Chen X
    iScience; 2021 Jun; 24(6):102616. PubMed ID: 34151230
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Enhanced delamination of ultrathin free-standing polymer films via self-limiting surface modification.
    Baxamusa SH; Stadermann M; Aracne-Ruddle C; Nelson AJ; Chea M; Li S; Youngblood K; Suratwala TI
    Langmuir; 2014 May; 30(18):5126-32. PubMed ID: 24784173
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Spontaneous Periodic Delamination of Thin Films To Form Crack-Free Metal and Silicon Ribbons with High Stretchability.
    Zhang Q; Tang Y; Hajfathalian M; Chen C; Turner KT; Dikin DA; Lin G; Yin J
    ACS Appl Mater Interfaces; 2017 Dec; 9(51):44938-44947. PubMed ID: 29182303
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Experimental and Simulated Investigations of Thin Polymer Substrates with an Indium Tin Oxide Coating under Fatigue Bending Loadings.
    Hsu JS; Lee CC; Wen BJ; Huang PC; Xie CK
    Materials (Basel); 2016 Aug; 9(9):. PubMed ID: 28773838
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Effect of microstructure on thermal conductivity of Cu, Ag thin films.
    Ryu S; Juhng W; Kim Y
    J Nanosci Nanotechnol; 2010 May; 10(5):3406-11. PubMed ID: 20358967
    [TBL] [Abstract][Full Text] [Related]  

  • 20. A Novel Measurement Method of Mechanical Properties for Individual Layers in Multilayered Thin Films.
    Zhou ZF; Meng MZ; Sun C; Huang QA
    Micromachines (Basel); 2019 Oct; 10(10):. PubMed ID: 31581644
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.