124 related articles for article (PubMed ID: 36629497)
1. Low-aberration ExB deflector optics for scanning electron microscopy.
Enyama M; Nishi R; Ito H; Yamasaki J
Microscopy (Oxf); 2023 Oct; 72(5):399-407. PubMed ID: 36629497
[TBL] [Abstract][Full Text] [Related]
2. Design for an aberration corrected scanning electron microscope using miniature electron mirrors.
Dohi H; Kruit P
Ultramicroscopy; 2018 Jun; 189():1-23. PubMed ID: 29574382
[TBL] [Abstract][Full Text] [Related]
3. The objective lens of the electron microscope with correction of spherical and axial chromatic aberrations.
Bimurzaev SB; Aldiyarov NU; Yakushev EM
Microscopy (Oxf); 2017 Oct; 66(5):356-365. PubMed ID: 29016920
[TBL] [Abstract][Full Text] [Related]
4. Analytical analysis and simulation on fringe field effect of deflector plates applied in ultrafast electron microscopy.
Zhang L; Dong Q
Micron; 2019 Nov; 126():102751. PubMed ID: 31525718
[TBL] [Abstract][Full Text] [Related]
5. Sub-ångstrom resolution using aberration corrected electron optics.
Batson PE; Dellby N; Krivanek OL
Nature; 2002 Aug; 418(6898):617-20. PubMed ID: 12167855
[TBL] [Abstract][Full Text] [Related]
6. Analyses of optical rays in KTN optical beam deflectors for device design.
Imai T; Ueno M; Sasaki Y; Sakamoto T
Appl Opt; 2017 Sep; 56(25):7277-7285. PubMed ID: 29047992
[TBL] [Abstract][Full Text] [Related]
7. Trajectory control of electron beams using high intensity permanent magnests for linac-adaptable convergent beam radiotherapy.
Figueroa RG; Rojas L; Valente M
Appl Radiat Isot; 2019 Sep; 151():13-18. PubMed ID: 31153053
[TBL] [Abstract][Full Text] [Related]
8. Signal detection and imaging methods for MEMS electron microscope.
Białas M; Grzebyk T; Krysztof M; Górecka-Drzazga A
Ultramicroscopy; 2023 Feb; 244():113653. PubMed ID: 36459864
[TBL] [Abstract][Full Text] [Related]
9. Three order increase in scanning speed of space charge-controlled KTN deflector by eliminating electric field induced phase transition in nanodisordered KTN.
Zhu W; Chao JH; Chen CJ; Yin S; Hoffman RC
Sci Rep; 2016 Sep; 6():33143. PubMed ID: 27610923
[TBL] [Abstract][Full Text] [Related]
10. Beam displacement and blur caused by fast electron beam deflection.
Zhang L; Garming MWH; Hoogenboom JP; Kruit P
Ultramicroscopy; 2020 Apr; 211():112925. PubMed ID: 31981842
[TBL] [Abstract][Full Text] [Related]
11. Field modeling and ray-tracing of a miniature scanning electron microscope beam column.
Loyd JS; Gregory DA; Gaskin JA
Microscopy (Oxf); 2017 Aug; 66(4):245-253. PubMed ID: 28371841
[TBL] [Abstract][Full Text] [Related]
12. A monochromatic, aberration-corrected, dual-beam low energy electron microscope.
Mankos M; Shadman K
Ultramicroscopy; 2013 Jul; 130():13-28. PubMed ID: 23582636
[TBL] [Abstract][Full Text] [Related]
13. Deflector designs for fish habitat restoration.
Biron PM; Robson C; Lapointe MF; Gaskin SJ
Environ Manage; 2004 Jan; 33(1):25-35. PubMed ID: 14994157
[TBL] [Abstract][Full Text] [Related]
14. Correction of parasitic aberrations of hexapole corrector using differential algebra method.
Radlička T
Ultramicroscopy; 2019 Sep; 204():81-90. PubMed ID: 31132735
[TBL] [Abstract][Full Text] [Related]
15. A simple electron-beam lithography system.
Mølhave K; Madsen DN; Bøggild P
Ultramicroscopy; 2005 Feb; 102(3):215-9. PubMed ID: 15639352
[TBL] [Abstract][Full Text] [Related]
16. A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design.
Tromp RM; Hannon JB; Ellis AW; Wan W; Berghaus A; Schaff O
Ultramicroscopy; 2010 Jun; 110(7):852-61. PubMed ID: 20395048
[TBL] [Abstract][Full Text] [Related]
17. A simple double-focusing electrostatic ion beam deflector.
Kreckel H; Bruhns H; Miller KA; Wåhlin E; Davis A; Höckh S; Savin DW
Rev Sci Instrum; 2010 Jun; 81(6):063304. PubMed ID: 20590234
[TBL] [Abstract][Full Text] [Related]
18. Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment.
Lee JW; Park IY; Ogawa T
Ultramicroscopy; 2024 Mar; 257():113908. PubMed ID: 38134559
[TBL] [Abstract][Full Text] [Related]
19. High-resolution spin-polarized scanning electron microscopy (spin SEM).
Kohashi T; Konoto M; Koike K
J Electron Microsc (Tokyo); 2010; 59(1):43-52. PubMed ID: 19840986
[TBL] [Abstract][Full Text] [Related]
20. Catadioptric aberration correction in cathode lens microscopy.
Tromp RM
Ultramicroscopy; 2015 Apr; 151():191-198. PubMed ID: 25458190
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]