These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
5. On the alignment for precession electron diffraction. Liao Y; Marks LD Ultramicroscopy; 2012 Jun; 117():1-6. PubMed ID: 22634134 [TBL] [Abstract][Full Text] [Related]
6. Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization. Paterson GW; Webster RWH; Ross A; Paton KA; Macgregor TA; McGrouther D; MacLaren I; Nord M Microsc Microanal; 2020 Oct; 26(5):944-963. PubMed ID: 32883393 [TBL] [Abstract][Full Text] [Related]
7. Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: state-of-the-art results. Viladot D; Véron M; Gemmi M; Peiró F; Portillo J; Estradé S; Mendoza J; Llorca-Isern N; Nicolopoulos S J Microsc; 2013 Oct; 252(1):23-34. PubMed ID: 23889078 [TBL] [Abstract][Full Text] [Related]
8. Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloys. Thronsen E; Bergh T; Thorsen TI; Christiansen EF; Frafjord J; Crout P; van Helvoort ATJ; Midgley PA; Holmestad R Ultramicroscopy; 2024 Jan; 255():113861. PubMed ID: 37852158 [TBL] [Abstract][Full Text] [Related]
9. A Comparison of a Direct Electron Detector and a High-Speed Video Camera for a Scanning Precession Electron Diffraction Phase and Orientation Mapping. MacLaren I; Frutos-Myro E; McGrouther D; McFadzean S; Weiss JK; Cosart D; Portillo J; Robins A; Nicolopoulos S; Nebot Del Busto E; Skogeby R Microsc Microanal; 2020 Dec; 26(6):1110-1116. PubMed ID: 32867871 [TBL] [Abstract][Full Text] [Related]
10. Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolution. Pennycook TJ; Lupini AR; Yang H; Murfitt MF; Jones L; Nellist PD Ultramicroscopy; 2015 Apr; 151():160-167. PubMed ID: 25458189 [TBL] [Abstract][Full Text] [Related]
11. A new approach for 3D reconstruction from bright field TEM imaging: beam precession assisted electron tomography. Rebled JM; Yedra L; Estradé S; Portillo J; Peiró F Ultramicroscopy; 2011; 111(9-10):1504-11. PubMed ID: 21930023 [TBL] [Abstract][Full Text] [Related]
12. Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction. Mahr C; Müller-Caspary K; Grieb T; Schowalter M; Mehrtens T; Krause FF; Zillmann D; Rosenauer A Ultramicroscopy; 2015 Nov; 158():38-48. PubMed ID: 26141289 [TBL] [Abstract][Full Text] [Related]
13. Prospects for aberration corrected electron precession. Own CS; Sinkler W; Marks LD Ultramicroscopy; 2007; 107(6-7):534-42. PubMed ID: 17207934 [TBL] [Abstract][Full Text] [Related]
14. Reconstructing dual-phase nanometer scale grains within a pearlitic steel tip in 3D through 4D-scanning precession electron diffraction tomography and automated crystal orientation mapping. Harrison P; Zhou X; Das SM; Lhuissier P; Liebscher CH; Herbig M; Ludwig W; Rauch EF Ultramicroscopy; 2022 Aug; 238():113536. PubMed ID: 35567967 [TBL] [Abstract][Full Text] [Related]
15. Structure solution with automated electron diffraction tomography data: different instrumental approaches. Gorelik TE; Stewart AA; Kolb U J Microsc; 2011 Dec; 244(3):325-31. PubMed ID: 21992494 [TBL] [Abstract][Full Text] [Related]
16. Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence. Grieb T; Krause FF; Schowalter M; Zillmann D; Sellin R; Müller-Caspary K; Mahr C; Mehrtens T; Bimberg D; Rosenauer A Ultramicroscopy; 2018 Jul; 190():45-57. PubMed ID: 29783102 [TBL] [Abstract][Full Text] [Related]
17. A method for crystallographic mapping of an alpha-beta titanium alloy with nanometre resolution using scanning precession electron diffraction and open-source software libraries. MacLaren I; Frutos-Myro E; Zeltmann S; Ophus C J Microsc; 2024 Aug; 295(2):131-139. PubMed ID: 38353362 [TBL] [Abstract][Full Text] [Related]
18. Precession electron diffraction-assisted crystal phase mapping of metastable c-GaN films grown on (001) GaAs. Ruiz-Zepeda F; Casallas-Moreno YL; Cantu-Valle J; Alducin D; Santiago U; José-Yacaman M; López-López M; Ponce A Microsc Res Tech; 2014 Dec; 77(12):980-5. PubMed ID: 25123258 [TBL] [Abstract][Full Text] [Related]
19. Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction. Jeong J; Jang WS; Kim KH; Kostka A; Gu G; Kim YM; Oh SH Microsc Microanal; 2021 Apr; 27(2):237-249. PubMed ID: 33541465 [TBL] [Abstract][Full Text] [Related]
20. Assessment of misorientation in metallic and semiconducting nanowires using precession electron diffraction. Estradé S; Portillo J; Mendoza J; Kosta I; Serret M; Müller C; Peiró F Micron; 2012 Aug; 43(8):910-5. PubMed ID: 22455799 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]