These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

122 related articles for article (PubMed ID: 37132813)

  • 21. [Multilayer mirrors used for the moon-based EUV imager].
    Liu Z; Gao JS; Chen B; Wang TT; Wang XY; Shen ZF; Chen H
    Guang Pu Xue Yu Guang Pu Fen Xi; 2013 Jan; 33(1):283-6. PubMed ID: 23586274
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Structural characterization and lifetime stability of Mo/Y extreme-ultraviolet multilayer mirrors.
    Kjornrattanawanich B; Bajt S
    Appl Opt; 2004 Nov; 43(32):5955-62. PubMed ID: 15587723
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Characterization of ultra smooth interfaces in Mo/Si-multilayers.
    Dietsch R; Holz T; Hopfe S; Mai H; Scholz R; Schöneich B; Wendrock H
    Anal Bioanal Chem; 1995 Oct; 353(3-4):383-8. PubMed ID: 15048504
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Extreme-ultraviolet Mo/Si multilayer mirrors deposited by radio-frequency-magnetron sputtering.
    Montcalm C; Sullivan BT; Pépin H; Dobrowolski JA; Sutton M
    Appl Opt; 1994 Apr; 33(10):2057-68. PubMed ID: 20885544
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Thermal stability of sputtered Mo/X and W/X (X = BN:O, B(4)C:O, Si, and C) multilayer soft-x-ray mirrors.
    Okada H; Mayama K; Goto Y; Kusunoki I; Yanagihara M
    Appl Opt; 1994 Jul; 33(19):4219-24. PubMed ID: 20935776
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Layer-by-layer design method for multilayers with barrier layers: application to Si/Mo multilayers for extreme-ultraviolet lithography.
    Larruquert JI
    J Opt Soc Am A Opt Image Sci Vis; 2004 Sep; 21(9):1750-60. PubMed ID: 15384442
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Pd/B4C/Y multilayer coatings for extreme ultraviolet applications near 10  nm wavelength.
    Windt DL; Gullikson EM
    Appl Opt; 2015 Jun; 54(18):5850-60. PubMed ID: 26193039
    [TBL] [Abstract][Full Text] [Related]  

  • 28. Analysis of buried interfaces in multilayer mirrors using grazing incidence extreme ultraviolet reflectometry near resonance edges.
    Sertsu MG; Nardello M; Giglia A; Corso AJ; Maurizio C; Juschkin L; Nicolosi P
    Appl Opt; 2015 Dec; 54(35):10351-8. PubMed ID: 26836858
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Mo-La
    Menzel SB; Seifert M; Priyadarshi A; Rane GK; Park E; Oswald S; Gemming T
    Materials (Basel); 2019 Aug; 12(17):. PubMed ID: 31438479
    [TBL] [Abstract][Full Text] [Related]  

  • 30. Performance optimization of Si/Gd extreme ultraviolet multilayers.
    Windt DL; Bellotti JA; Kjornrattanawanich B; Seely JF
    Appl Opt; 2009 Oct; 48(29):5502-8. PubMed ID: 19823233
    [TBL] [Abstract][Full Text] [Related]  

  • 31. SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO
    Vieira EMF; Toudert J; Rolo AG; Parisini A; Leitão JP; Correia MR; Franco N; Alves E; Chahboun A; Martín-Sánchez J; Serna R; Gomes MJM
    Nanotechnology; 2017 Aug; 28(34):345701. PubMed ID: 28628483
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Evolution of structure, phase composition, and x-ray reflectivity of multilayer mirrors mo-(B + C) after annealing at 250-1100°c.
    Kopilets IA; Kondratenko VV; Fedorenko AI; Zubarev EN; Poltseva OV; Ponomarenko AG; Lyakhovskaya II
    J Xray Sci Technol; 1996 Jan; 6(2):141-9. PubMed ID: 21307518
    [TBL] [Abstract][Full Text] [Related]  

  • 33. The Preparation of Amorphous ZrC/Nanocrystalline Ni Multilayers and the Resistance to He
    Jiang S; Zhu R; Hu X; Zhang J; Huang Z
    Materials (Basel); 2022 Apr; 15(9):. PubMed ID: 35591394
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Performance, structure, and stability of SiC/Al multilayer films for extreme ultraviolet applications.
    Windt DL; Bellotti JA
    Appl Opt; 2009 Sep; 48(26):4932-41. PubMed ID: 19745857
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Thickness-dependent structural characteristics for a sputtering-deposited chromium monolayer and Cr/C and Cr/Sc multilayers.
    Jiang H; Wang H; Zhu J; Xue C; Zhang J; Tian N; Li A
    J Synchrotron Radiat; 2018 May; 25(Pt 3):785-792. PubMed ID: 29714189
    [TBL] [Abstract][Full Text] [Related]  

  • 36. High reflectivity multilayer for He-II radiation at 30.4 nm.
    Zhu J; Wang Z; Zhang Z; Wang F; Wang H; Wu W; Zhang S; Xu D; Chen L; Zhou H; Huo T; Cui M; Zhao Y
    Appl Opt; 2008 May; 47(13):C310-4. PubMed ID: 18449265
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Iridium/silicon multilayers for extreme ultraviolet applications in the 20-35 nm wavelength range.
    Zuppella P; Monaco G; Corso AJ; Nicolosi P; Windt DL; Bello V; Mattei G; Pelizzo MG
    Opt Lett; 2011 Apr; 36(7):1203-5. PubMed ID: 21479030
    [TBL] [Abstract][Full Text] [Related]  

  • 38. Study of normal incidence of three-component multilayer mirrors in the range 20-40 nm.
    Gautier J; Delmotte F; Roulliay M; Bridou F; Ravet MF; Jérome A
    Appl Opt; 2005 Jan; 44(3):384-90. PubMed ID: 15717828
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Raman spectroscopic analysis of mo/si multilayers.
    Allred DD; Cai M; Wang Q; Hatch DM; Reyes-Mena A
    J Xray Sci Technol; 1992 Jan; 3(3):222-8. PubMed ID: 21307563
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Normal-incidence silicon-gadolinium multilayers for imaging at 63 nm wavelength.
    Kjornrattanawanich B; Windt DL; Seely JF
    Opt Lett; 2008 May; 33(9):965-7. PubMed ID: 18451954
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 7.