121 related articles for article (PubMed ID: 37405081)
1. Sources of Uncertainty in a DVM-Based Measurement System for a Quantized Hall Resistance Standard.
Lee KC; Cage ME; Rowe PS
J Res Natl Inst Stand Technol; 1994; 99(3):227-240. PubMed ID: 37405081
[TBL] [Abstract][Full Text] [Related]
2. Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards.
Rigosi AF; Panna AR; Payagala SU; Kruskopf M; Kraft ME; Jones GR; Wu BY; Lee HY; Yang Y; Hu J; Jarrett DG; Newell DB; Elmquist RE
IEEE Trans Instrum Meas; 2018; 68():. PubMed ID: 31274879
[TBL] [Abstract][Full Text] [Related]
3. Calculating the Effects of Longitudinal Resistance in Multi-Series-Connected Quantum Hall Effect Devices.
Cage ME; Jeffery A; Elmquist RE; Lee KC
J Res Natl Inst Stand Technol; 1998; 103(6):561-592. PubMed ID: 28009360
[TBL] [Abstract][Full Text] [Related]
4. Comparison between NIST Graphene and AIST GaAs Quantized Hall Devices.
Oe T; Rigosi AF; Kruskopf M; Wu BY; Lee HY; Yang Y; Elmquist RE; Kaneko NH; Jarrett DG
IEEE Trans Instrum Meas; 2019; 0():. PubMed ID: 32116347
[TBL] [Abstract][Full Text] [Related]
5. Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations.
Marzano M; Kruskopf M; Panna AR; Rigosi AF; Patel DK; Jin H; Cular S; Callegaro L; Elmquist RE; Ortolano M
Metrologia; 2020; 57(1):. PubMed ID: 32127725
[TBL] [Abstract][Full Text] [Related]
6. Comparison between Graphene and GaAs Quantized Hall Devices with a Dual Probe.
Payagala SU; Rigosi AF; Panna AR; Pollarolo A; Kruskopf M; Schlamminger S; Jarrett DG; Brown R; Elmquist RE; Brown D; Newell DB
IEEE Trans Instrum Meas; 2020; 69():9374-9380. PubMed ID: 33335334
[TBL] [Abstract][Full Text] [Related]
7. Quantum Hall resistance standard in graphene devices under relaxed experimental conditions.
Ribeiro-Palau R; Lafont F; Brun-Picard J; Kazazis D; Michon A; Cheynis F; Couturaud O; Consejo C; Jouault B; Poirier W; Schopfer F
Nat Nanotechnol; 2015 Nov; 10(11):965-71. PubMed ID: 26344181
[TBL] [Abstract][Full Text] [Related]
8. A Problem in AC Quantized Hall Resistance Measurements and a Proposed Solution.
Cage ME; Jeffery A
J Res Natl Inst Stand Technol; 1998; 103(6):593-604. PubMed ID: 28009363
[TBL] [Abstract][Full Text] [Related]
9. The Ampere and Electrical Standards.
Elmquist RE; Cage ME; Tang YH; Jeffery AM; Kinard JR; Dziuba RF; Oldham NM; Williams ER
J Res Natl Inst Stand Technol; 2001; 106(1):65-103. PubMed ID: 27500018
[TBL] [Abstract][Full Text] [Related]
10. Degradation of GaAs/AlGaAs Quantized Hall Resistors With Alloyed AuGe/Ni Contacts.
Lee KC
J Res Natl Inst Stand Technol; 1998; 103(2):177-200. PubMed ID: 28009368
[TBL] [Abstract][Full Text] [Related]
11. Graphene Quantum Hall Effect Devices for AC and DC Electrical Metrology.
Kruskopf M; Bauer S; Pimsut Y; Chatterjee A; Patel DK; Rigosi AF; Elmquist RE; Pierz K; Pesel E; Götz M; Schurr J
IEEE Trans Electron Devices; 2021 Jul; 68(7):. PubMed ID: 36452065
[TBL] [Abstract][Full Text] [Related]
12. Superconducting Contact Geometries for Next-Generation Quantized Hall Resistance Standards.
Panna AR; Kruskopf M; Rigosi AF; Marzano M; Patel DK; Payagala SU; Jarrett DG; Newell DB; Elmquist RE
IEEE Trans Instrum Meas; 2020; 1.633481E6():. PubMed ID: 33335333
[TBL] [Abstract][Full Text] [Related]
13. Calibration of Germanium Resistors at Low Temperatures (2-20° Kelvin).
Cataland G; Plumb HH
J Res Natl Bur Stand A Phys Chem; 1966; 70A(3):243-252. PubMed ID: 31823994
[TBL] [Abstract][Full Text] [Related]
14. Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry.
Kruskopf M; Rigosi AF; Panna AR; Patel DK; Jin H; Marzano M; Berilla M; Newell DB; Elmquist RE
IEEE Trans Electron Devices; 2019; 66(9):. PubMed ID: 32116346
[TBL] [Abstract][Full Text] [Related]
15. Ultrastable low-noise current amplifier: a novel device for measuring small electric currents with high accuracy.
Drung D; Krause C; Becker U; Scherer H; Ahlers FJ
Rev Sci Instrum; 2015 Feb; 86(2):024703. PubMed ID: 25725866
[TBL] [Abstract][Full Text] [Related]
16. Next-generation crossover-free quantum Hall arrays with superconducting interconnections.
Kruskopf M; Rigosi AF; Panna AR; Marzano M; Patel D; Jin H; Newell DB; Elmquist RE
Metrologia; 2019; 56(6):. PubMed ID: 32116392
[TBL] [Abstract][Full Text] [Related]
17. Special Report on Electrical Standards: New Internationally Adopted Reference Standards of Voltage and Resistance.
Taylor BN
J Res Natl Inst Stand Technol; 1989; 94(2):95-103. PubMed ID: 28053403
[TBL] [Abstract][Full Text] [Related]
18. Possible Changes in the U.S. Legal Units Of Voltage and Resistance.
Taylor BN
J Res Natl Bur Stand (1977); 1986; 91(5):299-305. PubMed ID: 34345087
[TBL] [Abstract][Full Text] [Related]
19. Epitaxial graphene for quantum resistance metrology.
Kruskopf M; Elmquist RE
Metrologia; 2018; 55():. PubMed ID: 30996479
[TBL] [Abstract][Full Text] [Related]
20. New method for determining time constant of resistors.
Wang Y; Jarrett D; Koffman A; Schlamminger S
Rev Sci Instrum; 2023 Mar; 94(3):034711. PubMed ID: 37012758
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
