These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

113 related articles for article (PubMed ID: 37616515)

  • 1. Contrast mechanism at landing energy near 0 eV in super low-energy scanning electron microscopy.
    Aoyama T; Mikmeková Š; Kumagai K
    Microscopy (Oxf); 2024 Jun; 73(3):243-250. PubMed ID: 37616515
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Visualization of three different phases in a multiphase steel by scanning electron microscopy at 1 eV landing energy.
    Aoyama T; Mikmeková Š; Hibino H; Okuda K
    Ultramicroscopy; 2019 Sep; 204():1-5. PubMed ID: 31078016
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Effect of native oxide on the crystal orientation contrast in SEM micrographs obtained at hundreds, tens and units of eV.
    Mikmeková Š; Aoyama T
    Ultramicroscopy; 2021 Jan; 220():113144. PubMed ID: 33126106
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Investigation of the Image Contrast in an Ultra-Low Voltage Scanning Electron Microscope Using an Auger Electron Spectrometer.
    Sakuda Y; Asahina S; Togashi T; Terasaki O; Kurihara M
    Microsc Microanal; 2020 Aug; 26(4):758-767. PubMed ID: 31753049
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Electron beam broadening in electron-transparent samples at low electron energies.
    Hugenschmidt M; Müller E; Gerthsen D
    J Microsc; 2019 Jun; 274(3):150-157. PubMed ID: 31001840
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy.
    Jóźwik I; Jagielski J; Dumiszewska E; Kamiński M; Kentsch U
    Ultramicroscopy; 2021 Sep; 228():113333. PubMed ID: 34134066
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Dual-phase steel structure visualized by extremely slow electrons.
    Mikmeková Š; Yamada K; Noro H
    Microscopy (Oxf); 2015 Dec; 64(6):437-43. PubMed ID: 26497974
    [TBL] [Abstract][Full Text] [Related]  

  • 8. The Design of a Reflection Electron Energy Loss Spectrometer Attachment for Low Voltage Scanning Electron Microscopy.
    Chuah J; Khursheed A
    Materials (Basel); 2021 Dec; 14(24):. PubMed ID: 34947108
    [TBL] [Abstract][Full Text] [Related]  

  • 9. TRIP steel microstructure visualized by slow and very slow electrons.
    Mikmeková Š; Yamada K; Noro H
    Microscopy (Oxf); 2013 Dec; 62(6):589-96. PubMed ID: 23797968
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment.
    Lee JW; Park IY; Ogawa T
    Ultramicroscopy; 2024 Mar; 257():113908. PubMed ID: 38134559
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Radiation damage in coronene, rubrene and p-terphenyl, measured for incident electrons of kinetic energy between 100 and 200 kev.
    Li P; Egerton RF
    Ultramicroscopy; 2004 Nov; 101(2-4):161-72. PubMed ID: 15450662
    [TBL] [Abstract][Full Text] [Related]  

  • 12. On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope.
    Sun C; Müller E; Meffert M; Gerthsen D
    Microsc Microanal; 2018 Apr; 24(2):99-106. PubMed ID: 29589573
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Kelvin probe force microscopy in nonpolar liquids.
    Domanski AL; Sengupta E; Bley K; Untch MB; Weber SA; Landfester K; Weiss CK; Butt HJ; Berger R
    Langmuir; 2012 Oct; 28(39):13892-9. PubMed ID: 22946889
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Key Role of Very Low Energy Electrons in Tin-Based Molecular Resists for Extreme Ultraviolet Nanolithography.
    Bespalov I; Zhang Y; Haitjema J; Tromp RM; van der Molen SJ; Brouwer AM; Jobst J; Castellanos S
    ACS Appl Mater Interfaces; 2020 Feb; 12(8):9881-9889. PubMed ID: 32019303
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM.
    Crouzier L; Delvallée A; Devoille L; Artous S; Saint-Antonin F; Feltin N
    Ultramicroscopy; 2021 Jul; 226():113300. PubMed ID: 33984665
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Methane dissociation on Ni(111) and Pt(111): energetic and dynamical studies.
    Nave S; Jackson B
    J Chem Phys; 2009 Feb; 130(5):054701. PubMed ID: 19206983
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Real-Space Mapping of Surface-Oxygen Defect States in Photovoltaic Materials Using Low-Voltage Scanning Ultrafast Electron Microscopy.
    Shaheen BS; El-Zohry AM; Zhao J; Yin J; Hedhili MN; Bakr OM; Mohammed OF
    ACS Appl Mater Interfaces; 2020 Feb; 12(6):7760-7767. PubMed ID: 31951364
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Low-voltage SEM of air-sensitive powders: From sample preparation to micro/nano analysis with secondary electron hyperspectral imaging.
    Nohl JF; Farr NTH; Sun Y; Hughes GM; Cussen SA; Rodenburg C
    Micron; 2022 May; 156():103234. PubMed ID: 35325668
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Comparison of scanning Kelvin probe with SEM/EPMA techniques for fingermark recovery from metallic surfaces.
    Challinger SE; Baikie ID; Flannigan G; Halls S; Laing K; Daly L; Nic Daeid N
    Forensic Sci Int; 2018 Oct; 291():44-52. PubMed ID: 30138750
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Imaging photoinduced surface potentials on hybrid perovskites by real-time Scanning Electron Microscopy.
    Irde G; Pietralunga SM; Sala V; Zani M; Ball JM; Barker AJ; Petrozza A; Lanzani G; Tagliaferri A
    Micron; 2019 Jun; 121():53-65. PubMed ID: 30947034
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.