These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
24. Hysteresis in Lanthanide Aluminum Oxides Observed by Fast Pulse CV Measurement. Zhao C; Zhao CZ; Lu Q; Yan X; Taylor S; Chalker PR Materials (Basel); 2014 Oct; 7(10):6965-6981. PubMed ID: 28788225 [TBL] [Abstract][Full Text] [Related]
25. Solution-Processed Dielectrics Based on Thickness-Sorted Two-Dimensional Hexagonal Boron Nitride Nanosheets. Zhu J; Kang J; Kang J; Jariwala D; Wood JD; Seo JW; Chen KS; Marks TJ; Hersam MC Nano Lett; 2015 Oct; 15(10):7029-36. PubMed ID: 26348822 [TBL] [Abstract][Full Text] [Related]
26. Characterization of Single Defects in Ultrascaled MoS Stampfer B; Zhang F; Illarionov YY; Knobloch T; Wu P; Waltl M; Grill A; Appenzeller J; Grasser T ACS Nano; 2018 Jun; 12(6):5368-5375. PubMed ID: 29878746 [TBL] [Abstract][Full Text] [Related]
27. Low-frequency noise in individual carbon nanotube field-effect transistors with top, side and back gate configurations: effect of gamma irradiation. Sydoruk VA; Goß K; Meyer C; Petrychuk MV; Danilchenko BA; Weber P; Stampfer C; Li J; Vitusevich SA Nanotechnology; 2014 Jan; 25(3):035703. PubMed ID: 24345726 [TBL] [Abstract][Full Text] [Related]
28. Long-Term Stability and Reliability of Black Phosphorus Field-Effect Transistors. Illarionov YY; Waltl M; Rzepa G; Kim JS; Kim S; Dodabalapur A; Akinwande D; Grasser T ACS Nano; 2016 Oct; 10(10):9543-9549. PubMed ID: 27704779 [TBL] [Abstract][Full Text] [Related]
29. Improved Gate Dielectric Deposition and Enhanced Electrical Stability for Single-Layer MoS2 MOSFET with an AlN Interfacial Layer. Qian Q; Li B; Hua M; Zhang Z; Lan F; Xu Y; Yan R; Chen KJ Sci Rep; 2016 Jun; 6():27676. PubMed ID: 27279454 [TBL] [Abstract][Full Text] [Related]
30. Double-Quantum-Well AlGaN/GaN Field Effect Transistors with Top and Back Gates: Electrical and Noise Characteristics. Dub M; Sai P; Sakowicz M; Janicki L; But DB; Prystawko P; Cywiński G; Knap W; Rumyantsev S Micromachines (Basel); 2021 Jun; 12(6):. PubMed ID: 34205287 [TBL] [Abstract][Full Text] [Related]
31. Utilizing the Diffusion of Fluorinated Polymers to Modify the Semiconductor/Dielectric Interface in Solution-Processed Conjugated Polymer Field-Effect Transistors. Yang Y; Hong Y; Wang X ACS Appl Mater Interfaces; 2021 Feb; 13(7):8682-8691. PubMed ID: 33565853 [TBL] [Abstract][Full Text] [Related]
32. Combination of Polymer Gate Dielectric and Two-Dimensional Semiconductor for Emerging Field-Effect Transistors. Choi J; Yoo H Polymers (Basel); 2023 Mar; 15(6):. PubMed ID: 36987175 [TBL] [Abstract][Full Text] [Related]
34. Nonvolatile and Neuromorphic Memory Devices Using Interfacial Traps in Two-Dimensional WSe Park S; Jeong Y; Jin HJ; Park J; Jang H; Lee S; Huh W; Cho H; Shin HG; Kim K; Lee CH; Choi S; Im S ACS Nano; 2020 Sep; 14(9):12064-12071. PubMed ID: 32816452 [TBL] [Abstract][Full Text] [Related]
35. Quantitative analysis of charge trapping and classification of sub-gap states in MoS Park J; Hur JH; Jeon S Nanotechnology; 2018 Apr; 29(17):175704. PubMed ID: 29176037 [TBL] [Abstract][Full Text] [Related]
36. Tailoring the transfer characteristics and hysteresis in MoS Prasad P; Garg M; Chandni U Nanoscale; 2020 Dec; 12(46):23817-23823. PubMed ID: 33237076 [TBL] [Abstract][Full Text] [Related]
37. Tunable Mobility in Double-Gated MoTe Ji H; Joo MK; Yi H; Choi H; Gul HZ; Ghimire MK; Lim SC ACS Appl Mater Interfaces; 2017 Aug; 9(34):29185-29192. PubMed ID: 28786660 [TBL] [Abstract][Full Text] [Related]
38. Polymer/oxide bilayer dielectric for hysteresis-minimized 1 V operating 2D TMD transistors. Yoon M; Ko KR; Min SW; Im S RSC Adv; 2018 Jan; 8(6):2837-2843. PubMed ID: 35541189 [TBL] [Abstract][Full Text] [Related]
39. Trap Profiling Based on Frequency Varied Charge Pumping Method for Hot Carrier Stressed Thin Gate Oxide Metal Oxide Semiconductors Field Effect Transistors. Choi P; Kim H; Kim S; Kim S; Javadi R; Park H; Choi B J Nanosci Nanotechnol; 2016 May; 16(5):4851-5. PubMed ID: 27483833 [TBL] [Abstract][Full Text] [Related]
40. Fabrication of high performance/highly functional field-effect transistor devices based on [6]phenacene thin films. Eguchi R; He X; Hamao S; Goto H; Okamoto H; Gohda S; Sato K; Kubozono Y Phys Chem Chem Phys; 2013 Dec; 15(47):20611-7. PubMed ID: 24185947 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]