These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

117 related articles for article (PubMed ID: 38112123)

  • 21. Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy.
    Hernández-Maldonado D; Herrera M; Alonso-González P; González Y; González L; Gazquez J; Varela M; Pennycook SJ; Guerrero-Lebrero Mde L; Pizarro J; Galindo PL; Molina SI
    Microsc Microanal; 2011 Aug; 17(4):578-81. PubMed ID: 21615979
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam Microscope.
    MacLaren I; Nord M; Jiao C; Yücelen E
    Microsc Microanal; 2019 Feb; 25(1):115-118. PubMed ID: 30696493
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Nanoporous Structure Formation on the Surface of InSb by Ion Beam Irradiation.
    Miyaji T; Nitta N
    Nanomaterials (Basel); 2017 Jul; 7(8):. PubMed ID: 28758955
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling.
    Sasaki H; Matsuda T; Kato T; Muroga T; Iijima Y; Saitoh T; Iwase F; Yamada Y; Izumi T; Shiohara Y; Hirayama T
    J Electron Microsc (Tokyo); 2004; 53(5):497-500. PubMed ID: 15582954
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Effect of gallium focused ion beam milling on preparation of aluminium thin foils.
    Unocic KA; Mills MJ; Daehn GS
    J Microsc; 2010 Dec; 240(3):227-38. PubMed ID: 21077883
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Amorphization induced by focused ion beam milling in metallic and electronic materials.
    Huh Y; Hong KJ; Shin KS
    Microsc Microanal; 2013 Aug; 19 Suppl 5():33-7. PubMed ID: 23920170
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Using Xe Plasma FIB for High-Quality TEM Sample Preparation.
    Vitale SM; Sugar JD
    Microsc Microanal; 2022 Mar; ():1-13. PubMed ID: 35289261
    [TBL] [Abstract][Full Text] [Related]  

  • 28. Indirectly pumped 3.7 THz InGaAs/InAlAs quantum-cascade lasers grown by metal-organic vapor-phase epitaxy.
    Fujita K; Yamanishi M; Furuta S; Tanaka K; Edamura T; Kubis T; Klimeck G
    Opt Express; 2012 Aug; 20(18):20647-58. PubMed ID: 23037112
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Rashba spin-orbit coupling probed by the weak antilocalization analysis in InAlAs/InGaAs/InAlAs quantum wells as a function of quantum well asymmetry.
    Koga T; Nitta J; Akazaki T; Takayanagi H
    Phys Rev Lett; 2002 Jul; 89(4):046801. PubMed ID: 12144493
    [TBL] [Abstract][Full Text] [Related]  

  • 30. Hybrid planar microresonators with organic and InGaAs active media.
    Mialichi JR; Camposeo A; Persano L; Barea LA; Del Carro P; Pisignano D; Frateschi NC
    Opt Express; 2010 May; 18(11):11650-6. PubMed ID: 20589023
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Focused ion beam scanning electron microscopy in biology.
    Kizilyaprak C; Daraspe J; Humbel BM
    J Microsc; 2014 Jun; 254(3):109-14. PubMed ID: 24707797
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Surface damage induced by FIB milling and imaging of biological samples is controllable.
    Drobne D; Milani M; Leser V; Tatti F
    Microsc Res Tech; 2007 Oct; 70(10):895-903. PubMed ID: 17661360
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Method for Cross-sectional Transmission Electron Microscopy Specimen Preparation of Composite Materials Using a Dedicated Focused Ion Beam System.
    Yaguchi T; Kamino T; Ishitani T; Urao R
    Microsc Microanal; 1999 Sep; 5(5):365-370. PubMed ID: 10473682
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Electro-optical effects in strain-compensated InGaAs/InAlAs coupled quantum wells with modified potential.
    Xu Z; Wang C; Qi W; Yuan Z
    Opt Lett; 2010 Mar; 35(5):736-8. PubMed ID: 20195336
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Understanding Ion-Beam Damage to Air-Sensitive Lithium Metal With Cryogenic Electron and Ion Microscopy.
    Koh H; Detsi E; Stach EA
    Microsc Microanal; 2023 Jul; 29(4):1350-1356. PubMed ID: 37488829
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Direct insights on flax fiber structure by focused ion beam microscopy.
    Domenges B; Charlet K
    Microsc Microanal; 2010 Apr; 16(2):175-82. PubMed ID: 20100381
    [TBL] [Abstract][Full Text] [Related]  

  • 37. A review of focused ion beam technology and its applications in transmission electron microscopy.
    Sugiyama M; Sigesato G
    J Electron Microsc (Tokyo); 2004; 53(5):527-36. PubMed ID: 15582961
    [TBL] [Abstract][Full Text] [Related]  

  • 38. Integration of epitaxially-grown InGaAs/GaAs quantum dot lasers with hydrogenated amorphous silicon waveguides on silicon.
    Yang J; Bhattacharya P
    Opt Express; 2008 Mar; 16(7):5136-40. PubMed ID: 18542613
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Measurements of the Thermal Resistivity of InAlAs, InGaAs, and InAlAs/InGaAs Superlattices.
    Jaffe GR; Mei S; Boyle C; Kirch JD; Savage DE; Botez D; Mawst LJ; Knezevic I; Lagally MG; Eriksson MA
    ACS Appl Mater Interfaces; 2019 Mar; 11(12):11970-11975. PubMed ID: 30807087
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Simultaneous quantification of indium and nitrogen concentration in InGaNAs using HAADF-STEM.
    Grieb T; Müller K; Cadel E; Beyer A; Schowalter M; Talbot E; Volz K; Rosenauer A
    Microsc Microanal; 2014 Dec; 20(6):1740-52. PubMed ID: 25268110
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 6.