These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

109 related articles for article (PubMed ID: 38366381)

  • 1. In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View.
    Schwarz TM; Woods E; Singh MP; Chen X; Jung C; Aota LS; Jang K; Krämer M; Kim SH; McCarroll I; Gault B
    Microsc Microanal; 2024 Feb; ():. PubMed ID: 38366381
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Criteria and considerations for preparing atom-probe tomography specimens of nanomaterials utilizing an encapsulation methodology.
    Sun Z; Hazut O; Yerushalmi R; Lauhon LJ; Seidman DN
    Ultramicroscopy; 2018 Jan; 184(Pt A):225-233. PubMed ID: 28985626
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Pulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometry.
    Adineh VR; Marceau RKW; Chen Y; Si KJ; Velkov T; Cheng W; Li J; Fu J
    Ultramicroscopy; 2017 Oct; 181():150-159. PubMed ID: 28558288
    [TBL] [Abstract][Full Text] [Related]  

  • 4. In Situ Sputtering From the Micromanipulator to Enable Cryogenic Preparation of Specimens for Atom Probe Tomography by Focused-Ion Beam.
    Douglas JO; Conroy M; Giuliani F; Gault B
    Microsc Microanal; 2023 Jun; 29(3):1009-1017. PubMed ID: 37749683
    [TBL] [Abstract][Full Text] [Related]  

  • 5. A Versatile and Reproducible Cryo-sample Preparation Methodology for Atom Probe Studies.
    Woods EV; Singh MP; Kim SH; Schwarz TM; Douglas JO; El-Zoka AA; Giulani F; Gault B
    Microsc Microanal; 2023 Dec; 29(6):1992-2003. PubMed ID: 37856778
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Some aspects of atom probe specimen preparation and analysis of thin film materials.
    Thompson GB; Miller MK; Fraser HL
    Ultramicroscopy; 2004 Jul; 100(1-2):25-34. PubMed ID: 15219690
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Atom probe specimen preparation with a dual beam SEM/FIB miller.
    Miller MK; Russell KF
    Ultramicroscopy; 2007 Sep; 107(9):761-6. PubMed ID: 17403581
    [TBL] [Abstract][Full Text] [Related]  

  • 8. On the fabrication of atom probe tomography specimens of Al alloys at room temperature using focused ion beam milling with liquid Ga ion source.
    Mondal S; Bansal U; Makineni SK
    Microsc Res Tech; 2022 Sep; 85(9):3040-3049. PubMed ID: 35560854
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers.
    Diercks DR; Gorman BP; Mulders JJL
    Microsc Microanal; 2017 Apr; 23(2):321-328. PubMed ID: 27748214
    [TBL] [Abstract][Full Text] [Related]  

  • 10. New approach for FIB-preparation of atom probe specimens for aluminum alloys.
    Lilensten L; Gault B
    PLoS One; 2020; 15(4):e0231179. PubMed ID: 32240256
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Sample preparation toward seamless 3D imaging technique from micrometer to nanometer scale.
    Miyake A; Matsuno J; Toh S
    Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i24-i25. PubMed ID: 25359821
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique.
    Choi PP; Kwon YS; Kim JS; Al-Kassab T
    J Electron Microsc (Tokyo); 2007 Apr; 56(2):43-9. PubMed ID: 17928320
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Broadening the applications of the atom probe technique by ultraviolet femtosecond laser.
    Hono K; Ohkubo T; Chen YM; Kodzuka M; Oh-ishi K; Sepehri-Amin H; Li F; Kinno T; Tomiya S; Kanitani Y
    Ultramicroscopy; 2011 May; 111(6):576-83. PubMed ID: 21177036
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features.
    Hartshorne MI; Isheim D; Seidman DN; Taheri ML
    Ultramicroscopy; 2014 Dec; 147():25-32. PubMed ID: 24976357
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Application of focused ion beam to atom probe tomography specimen preparation from mechanically alloyed powders.
    Choi PP; Al-Kassab T; Kwon YS; Kim JS; Kirchheim R
    Microsc Microanal; 2007 Oct; 13(5):347-53. PubMed ID: 17900385
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Efficient preparation of microtip arrays for atom probe tomography using fs-laser processing.
    Tkadletz M; Waldl H; Schiester M; Lechner A; Schusser G; Krause M; Schalk N
    Ultramicroscopy; 2023 Apr; 246():113672. PubMed ID: 36586198
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography.
    Prosa TJ; Larson DJ
    Microsc Microanal; 2017 Apr; 23(2):194-209. PubMed ID: 28162119
    [TBL] [Abstract][Full Text] [Related]  

  • 18. A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction.
    Babinsky K; De Kloe R; Clemens H; Primig S
    Ultramicroscopy; 2014 Sep; 144():9-18. PubMed ID: 24815026
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows.
    Rickard WDA; Reddy SM; Saxey DW; Fougerouse D; Timms NE; Daly L; Peterman E; Cavosie AJ; Jourdan F
    Microsc Microanal; 2020 Aug; 26(4):750-757. PubMed ID: 32148216
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Shaping the lens of the atom probe: fabrication of site specific, oriented specimens and application to grain boundary analysis.
    Felfer P; Ringer SP; Cairney JM
    Ultramicroscopy; 2011 May; 111(6):435-9. PubMed ID: 21247698
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.