These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
112 related articles for article (PubMed ID: 38615522)
1. Strain visualization using large-angle convergent-beam electron diffraction. Uesugi F; Tanii C; Sugiyama N; Takeguchi M Ultramicroscopy; 2024 Jul; 261():113966. PubMed ID: 38615522 [TBL] [Abstract][Full Text] [Related]
2. Large-Angle Rocking Beam Electron Diffraction of Large Unit Cell Crystals Using Direct Electron Detector. Busch R; Ni HC; Shao YT; Zuo JM Microsc Microanal; 2024 Oct; ():. PubMed ID: 39353861 [TBL] [Abstract][Full Text] [Related]
3. Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map. Bekarevich R; Mitsuishi K; Ohnishi T; Uesugi F; Takeguchi M; Inaguma Y; Ohno T; Takada K Microscopy (Oxf); 2018 Mar; 67(suppl_1):i142-i149. PubMed ID: 29253238 [TBL] [Abstract][Full Text] [Related]
4. Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography. Béché A; Rouvière JL; Barnes JP; Cooper D Ultramicroscopy; 2013 Aug; 131():10-23. PubMed ID: 23673283 [TBL] [Abstract][Full Text] [Related]
9. Evaluation of accuracy in the determination of crystal structure factors using large-angle convergent-beam electron diffraction patterns. Morikawa D; Tsuda K Microscopy (Oxf); 2021 Mar; 70(2):178-185. PubMed ID: 32691038 [TBL] [Abstract][Full Text] [Related]
10. Evaluation of two-dimensional strain distribution by STEM/NBD. Uesugi F; Hokazono A; Takeno S Ultramicroscopy; 2011 Jul; 111(8):995-8. PubMed ID: 21740862 [TBL] [Abstract][Full Text] [Related]
11. Digital electron diffraction--seeing the whole picture. Beanland R; Thomas PJ; Woodward DI; Thomas PA; Roemer RA Acta Crystallogr A; 2013 Jul; 69(Pt 4):427-34. PubMed ID: 23778099 [TBL] [Abstract][Full Text] [Related]
12. LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a C(s) corrector: comparison with electron precession. Morniroli JP; Houdellier F; Roucau C; Puiggalí J; Gestí S; Redjaïmia A Ultramicroscopy; 2008 Jan; 108(2):100-15. PubMed ID: 17517476 [TBL] [Abstract][Full Text] [Related]
13. Dynamical simulation of LACBED patterns in cross-sectioned heterostructures. Wu F; Armigliato A; Balboni R; Frabboni S Micron; 2000 Jun; 31(3):211-6. PubMed ID: 10702968 [TBL] [Abstract][Full Text] [Related]
14. CBED and LACBED: characterization of antiphase boundaries. Morniroli JP; Nó ML; Rodríguez PP; San Juan J; Jezierska E; Michel N; Poulat S; Priester L Ultramicroscopy; 2003 Dec; 98(1):9-26. PubMed ID: 14609639 [TBL] [Abstract][Full Text] [Related]
15. LACBED measurement of the chemical composition of a thin In(x)Ga(1-x)As layer buried in a GaAs matrix. Jacob D; Androussi Y; Lefebvre A Ultramicroscopy; 2001 Nov; 89(4):299-303. PubMed ID: 11766985 [TBL] [Abstract][Full Text] [Related]
16. Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction. Mahr C; Müller-Caspary K; Ritz R; Simson M; Grieb T; Schowalter M; Krause FF; Lackmann A; Soltau H; Wittstock A; Rosenauer A Ultramicroscopy; 2019 Jan; 196():74-82. PubMed ID: 30291992 [TBL] [Abstract][Full Text] [Related]
17. Three-dimensional visualization of dislocations in a ferromagnetic material by magnetic-field-free electron tomography. Hasezaki KL; Saito H; Sannomiya T; Miyazaki H; Gondo T; Miyazaki S; Hata S Ultramicroscopy; 2017 Nov; 182():249-257. PubMed ID: 28779615 [TBL] [Abstract][Full Text] [Related]
18. Convergent beam diffraction studies of interfaces, defects, and multilayers. Cherns D; Preston AR J Electron Microsc Tech; 1989 Oct; 13(2):111-22. PubMed ID: 2809768 [TBL] [Abstract][Full Text] [Related]
19. Analysis of grain boundary dislocations by large angle convergent beam electron diffraction. Morniroli JP; Cherns D Ultramicroscopy; 1996 Jan; 62(1-2):53-63. PubMed ID: 22666917 [TBL] [Abstract][Full Text] [Related]
20. Structure refinement from 'digital' large angle convergent beam electron diffraction patterns. Hubert AJM; Römer R; Beanland R Ultramicroscopy; 2019 Mar; 198():1-9. PubMed ID: 30611110 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]