These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
118 related articles for article (PubMed ID: 39074487)
21. Role of Oxygen Source on Buried Interfaces in Atomic-Layer-Deposited Ferroelectric Hafnia-Zirconia Thin Films. Hsain HA; Lee Y; Lancaster S; Materano M; Alcala R; Xu B; Mikolajick T; Schroeder U; Parsons GN; Jones JL ACS Appl Mater Interfaces; 2022 Sep; 14(37):42232-42244. PubMed ID: 36069477 [TBL] [Abstract][Full Text] [Related]
22. Effects of electrode materials on the performance of Zr Cao Y; Zhang W; Shi Y; Xiao J; Li Y Nanotechnology; 2023 May; 34(31):. PubMed ID: 37130511 [TBL] [Abstract][Full Text] [Related]
23. Impact of asymmetric electrodes on ferroelectricity of sub-10 nm HZO thin films. Chen HY; Jiang YS; Chuang CH; Mo CL; Wang TY; Lin HC; Chen MJ Nanotechnology; 2023 Dec; 35(10):. PubMed ID: 37995361 [TBL] [Abstract][Full Text] [Related]
24. A synergistic interplay between dopant ALD cycles and film thickness on the improvement of the ferroelectricity of uncapped Al:HfO Yao L; Liu X; Cheng Y; Xiao B Nanotechnology; 2021 Mar; 32(21):. PubMed ID: 33601350 [TBL] [Abstract][Full Text] [Related]
25. Effects of Oxygen Flow during Fabrication by Magnetron Sputtering on Structure and Performance of Zr-Doped HfO Xi Y; Liu L; Zhao J; Qin X; Zhang J; Zhang C; Liu W Materials (Basel); 2023 Aug; 16(16):. PubMed ID: 37629850 [TBL] [Abstract][Full Text] [Related]
26. Pure ZrO Wang Z; Guan Z; Wang H; Zhou X; Li J; Shen S; Yin Y; Li X ACS Appl Mater Interfaces; 2024 May; 16(17):22122-22130. PubMed ID: 38626418 [TBL] [Abstract][Full Text] [Related]
27. Improved Ferroelectric Switching Endurance of La-Doped Hf Chernikova AG; Kozodaev MG; Negrov DV; Korostylev EV; Park MH; Schroeder U; Hwang CS; Markeev AM ACS Appl Mater Interfaces; 2018 Jan; 10(3):2701-2708. PubMed ID: 29282976 [TBL] [Abstract][Full Text] [Related]
28. Tunable defect engineering of Mo/TiON electrode in angstrom-laminated HfO Wang SM; Liu CR; Chen YT; Lee SC; Tang YT Nanotechnology; 2024 Feb; 35(20):. PubMed ID: 38316042 [TBL] [Abstract][Full Text] [Related]
29. Electric field-induced crystallization of ferroelectric hafnium zirconium oxide. Lederer M; Abdulazhanov S; Olivo R; Lehninger D; Kämpfe T; Seidel K; Eng LM Sci Rep; 2021 Nov; 11(1):22266. PubMed ID: 34782687 [TBL] [Abstract][Full Text] [Related]
30. Improving the ferroelectric properties of Lu doped Hf Xiao Y; Yang L; Jiang Y; Liu S; Li G; Ouyang J; Tang M Nanotechnology; 2024 Jul; 35(38):. PubMed ID: 38925105 [TBL] [Abstract][Full Text] [Related]
31. Epitaxial Integration on Si(001) of Ferroelectric Hf Lyu J; Fina I; Fontcuberta J; Sánchez F ACS Appl Mater Interfaces; 2019 Feb; 11(6):6224-6229. PubMed ID: 30657323 [TBL] [Abstract][Full Text] [Related]
32. Enhanced Ferroelectric Properties and Insulator-Metal Transition-Induced Shift of Polarization-Voltage Hysteresis Loop in VO Zhang Y; Fan Z; Wang D; Wang J; Zou Z; Li Y; Li Q; Tao R; Chen D; Zeng M; Gao X; Dai J; Zhou G; Lu X; Liu JM ACS Appl Mater Interfaces; 2020 Sep; 12(36):40510-40517. PubMed ID: 32805812 [TBL] [Abstract][Full Text] [Related]
37. The Doping Effect on the Intrinsic Ferroelectricity in Hafnium Oxide-Based Nano-Ferroelectric Devices. Li Z; Wei J; Meng J; Liu Y; Yu J; Wang T; Xu K; Liu P; Zhu H; Chen S; Sun QQ; Zhang DW; Chen L Nano Lett; 2023 May; 23(10):4675-4682. PubMed ID: 36913490 [TBL] [Abstract][Full Text] [Related]
38. Direct comparison of ferroelectric properties in Hf Hur J; Tasneem N; Choe G; Wang P; Wang Z; Khan AI; Yu S Nanotechnology; 2020 Dec; 31(50):505707. PubMed ID: 32663805 [TBL] [Abstract][Full Text] [Related]
39. Atomic-Scale Scanning of Domain Network in the Ferroelectric HfO Park K; Kim D; Lee K; Lee HJ; Kim J; Kang S; Lin A; Pattison AJ; Theis W; Kim CH; Choi H; Cho JW; Ercius P; Lee JH; Chae SC; Park J ACS Nano; 2024 Sep; ():. PubMed ID: 39265148 [TBL] [Abstract][Full Text] [Related]
40. Experimental study of endurance characteristics of Al-doped HfO Choi Y; Shin J; Moon S; Min J; Han C; Shin C Nanotechnology; 2023 Feb; 34(18):. PubMed ID: 36724507 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]