401 related articles for article (PubMed ID: 8563043)
1. A transmission electron microscope (TEM) calibration standard sample for all magnification, camera constant, and image/diffraction pattern rotation calibrations.
McCaffrey JP; Baribeau JM
Microsc Res Tech; 1995 Dec; 32(5):449-54. PubMed ID: 8563043
[TBL] [Abstract][Full Text] [Related]
2. Application of the small-angle cleavage technique to thickness measurement of TEM samples.
McCaffrey JP
Microsc Res Tech; 1997 Mar; 36(5):372-7. PubMed ID: 9140937
[TBL] [Abstract][Full Text] [Related]
3. Thin dielectric film thickness determination by advanced transmission electron microscopy.
Diebold AC; Foran B; Kisielowski C; Muller DA; Pennycook SJ; Principe E; Stemmer S
Microsc Microanal; 2003 Dec; 9(6):493-508. PubMed ID: 14750984
[TBL] [Abstract][Full Text] [Related]
4. Large-area plan-view sample preparation for GaAs-based systems grown by molecular beam epitaxy.
Howard DJ; Paine DC; Sacks RN
J Electron Microsc Tech; 1991 Jun; 18(2):117-20. PubMed ID: 1885995
[TBL] [Abstract][Full Text] [Related]
5. Development of computer-assisted minimal-dose system with beam blanker for TEM.
Hayashida M; Nomaguchi T; Kimura Y; Takai Y
Micron; 2007; 38(5):505-12. PubMed ID: 17045804
[TBL] [Abstract][Full Text] [Related]
6. Selective etching of AlAs for preparation of III-V semiconductor thin foils.
Breen KR; Wilson RA; McClintock JA; Ahearn JS
Microsc Res Tech; 1993 Jul; 25(4):291-6. PubMed ID: 8358079
[TBL] [Abstract][Full Text] [Related]
7. Imaging and analysis of nanowires.
Bell DC; Wu Y; Barrelet CJ; Gradecak S; Xiang J; Timko BP; Lieber CM
Microsc Res Tech; 2004 Aug; 64(5-6):373-89. PubMed ID: 15549698
[TBL] [Abstract][Full Text] [Related]
8. Epitaxial Fe3Si films on GaAs(100) substrates by means of electron beam evaporation.
Thomas J; Schumann J; Vinzelberg H; Arushanov E; Engelhard R; Schmidt OG; Gemming T
Nanotechnology; 2009 Jun; 20(23):235604. PubMed ID: 19451681
[TBL] [Abstract][Full Text] [Related]
9. Searching ultimate nanometrology for AlOx thickness in magnetic tunnel junction by analytical electron microscopy and X-ray reflectometry.
Song SA; Hirano T; Park JB; Kaji K; Kim KH; Terada S
Microsc Microanal; 2005 Oct; 11(5):431-45. PubMed ID: 17481324
[TBL] [Abstract][Full Text] [Related]
10. Direct UHV-TEM observation of palladium clusters on a silicon surface.
Takeguchi M; Mitsuishi K; Tanaka M; Furuya K
Microsc Microanal; 2004 Feb; 10(1):134-8. PubMed ID: 15306077
[TBL] [Abstract][Full Text] [Related]
11. A technique for the preparation of cross-sectional TEM samples of ZnSe/GaAs heterostructures which eliminates process-induced defects.
Yu JE; Jones KS; Park RM
J Electron Microsc Tech; 1991 Jul; 18(3):315-24. PubMed ID: 1880604
[TBL] [Abstract][Full Text] [Related]
12. DiffTools: electron diffraction software tools for DigitalMicrograph.
Mitchell DR
Microsc Res Tech; 2008 Aug; 71(8):588-93. PubMed ID: 18567012
[TBL] [Abstract][Full Text] [Related]
13. Dark field transmission electron microscope images of III-V quantum dot structures.
Beanland R
Ultramicroscopy; 2005 Jan; 102(2):115-25. PubMed ID: 15590135
[TBL] [Abstract][Full Text] [Related]
14. Comparison of phase contrast transmission electron microscopy with optimized scanning transmission annular dark field imaging for protein imaging.
Rez P
Ultramicroscopy; 2003 Jul; 96(1):117-24. PubMed ID: 12623176
[TBL] [Abstract][Full Text] [Related]
15. Automated magnification calibration in transmission electron microscopy using Fourier analysis of replica images.
van der Laak JA; Dijkman HB; Pahlplatz MM
Ultramicroscopy; 2006 Mar; 106(4-5):255-60. PubMed ID: 16289852
[TBL] [Abstract][Full Text] [Related]
16. An image processing/stereological analysis system for transmission electron microscopy.
Poole MC
Microsc Res Tech; 1992 Jun; 21(4):283-91. PubMed ID: 1638049
[TBL] [Abstract][Full Text] [Related]
17. Preparation of cross-sectional transmission electron microscopy samples by electron beam lithography and reactive ion etching.
Wetzel JT
J Electron Microsc Tech; 1989 Jan; 11(1):62-9. PubMed ID: 2915262
[TBL] [Abstract][Full Text] [Related]
18. Scanning image detection (SID) system for conventional transmission electron microscope (CTEM) images.
Tanji T; Tomita M; Kobayashi H
J Electron Microsc Tech; 1990 Aug; 15(4):397-9. PubMed ID: 2391565
[TBL] [Abstract][Full Text] [Related]
19. Quantitative image correction and calibration for confocal fluorescence microscopy using thin reference layers and SIPchart-based calibration procedures.
Zwier JM; Oomen L; Brocks L; Jalink K; Brakenhoff GJ
J Microsc; 2008 Jul; 231(Pt 1):59-69. PubMed ID: 18638190
[TBL] [Abstract][Full Text] [Related]
20. D-stem: a parallel electron diffraction technique applied to nanomaterials.
Ganesh KJ; Kawasaki M; Zhou JP; Ferreira PJ
Microsc Microanal; 2010 Oct; 16(5):614-21. PubMed ID: 20804634
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
