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  • Title: Interlayer structures of the chiral smectic liquid crystal phases revealed by resonant X-ray scattering.
    Author: Hirst LS, Watson SJ, Gleeson HF, Cluzeau P, Barois P, Pindak R, Pitney J, Cady A, Johnson PM, Huang CC, Levelut AM, Srajer G, Pollmann J, Caliebe W, Seed A, Herbert MR, Goodby JW, Hird M.
    Journal: Phys Rev E Stat Nonlin Soft Matter Phys; 2002 Apr; 65(4 Pt 1):041705. PubMed ID: 12005844.
    Abstract:
    The structures of the liquid crystalline chiral subphases exhibited by several materials containing either a selenium or sulphur atom have been investigated using a resonant x-ray scattering technique. This technique provides a unique structural probe for the ferroelectric, ferrielectric, antiferroelectric, and SmC(*)(alpha) phases. An analysis of the scattering features allows the structural models of the different subphases to be distinguished, in addition to providing a measurement of the helical pitch. This paper reports resonant scattering features in the antiferroelectric hexatic phase, the three- and four-layer intermediate phases, the antiferroelectric and ferroelectric phases and the SmC(*)(alpha) phase. The helicoidal pitch has been measured from the scattering peaks in the four-layer intermediate phase as well as in the antiferroelectric and ferroelectric phases. In the SmC(*)(alpha) phase, an investigation into the helical structure has revealed a pitch ranging from 5 to 54 layers in different materials. Further, a strong resonant scattering signal has been observed in mixtures of a selenium containing material with as much as 90% nonresonant material.
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