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Title: Characterization and fabrication of fully metal-coated scanning near-field optical microscopy SiO2 tips. Author: Aeschimann L, Akiyama T, Staufer U, De Rooij NF, Thiery L, Eckert R, Heinzelmann H. Journal: J Microsc; 2003 Mar; 209(Pt 3):182-7. PubMed ID: 12641759. Abstract: The fabrication of silicon cantilever-based scanning near-field optical microscope probes with fully aluminium-coated quartz tips was optimized to increase production yield. Different cantilever designs for dynamic- and contact-mode force feedback were implemented. Light transmission through the tips was investigated experimentally in terms of the metal coating and the tip cone-angle. We found that transmittance varies with the skin depth of the metal coating and is inverse to the cone angle, meaning that slender tips showed higher transmission. Near-field optical images of individual fluorescing molecules showed a resolution < 100 nm. Scanning electron microscopy images of tips before and after scanning near-field optical microscope imaging, and transmission electron microscopy analysis of tips before and after illumination, together with measurements performed with a miniaturized thermocouple showed no evidence of mechanical defect or orifice formation by thermal effects.[Abstract] [Full Text] [Related] [New Search]