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  • Title: Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics.
    Author: Mimura H, Yamauchi K, Yamamura K, Kubota A, Matsuyama S, Sano Y, Ueno K, Endo K, Nishino Y, Tamasaku K, Yabashi M, Ishikawa T, Mori Y.
    Journal: J Synchrotron Radiat; 2004 Jul 01; 11(Pt 4):343-6. PubMed ID: 15211041.
    Abstract:
    A new figure correction method has been applied in order to fabricate an elliptical mirror to realize a one-dimensionally diverging X-ray beam having high image quality. Mutual relations between figure errors and intensity uniformities of diverging X-ray beams have also been investigated using a wave-optical simulator and indicate that figure errors in relatively short spatial wavelength ranges lead to high-contrast interference fringes. By using a microstitching interferometer and elastic emission machining, figure correction of an elliptical mirror with a lateral resolution close to 0.1 mm was carried out. A one-dimensional diverging X-ray obtained using the fabricated mirror was observed at SPring-8 and evaluated to have a sufficiently flat intensity distribution.
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