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  • Title: Measurement of the bending strength of vapor-liquid-solid grown silicon nanowires.
    Author: Hoffmann S, Utke I, Moser B, Michler J, Christiansen SH, Schmidt V, Senz S, Werner P, Gösele U, Ballif C.
    Journal: Nano Lett; 2006 Apr; 6(4):622-5. PubMed ID: 16608255.
    Abstract:
    The fracture strength of silicon nanowires grown on a [111] silicon substrate by the vapor-liquid-solid process was measured. The nanowires, with diameters between 100 and 200 nm and a typical length of 2 microm, were subjected to bending tests using an atomic force microscopy setup inside a scanning electron microscope. The average strength calculated from the maximum nanowire deflection before fracture was around 12 GPa, which is 6% of the Young's modulus of silicon along the nanowire direction. This value is close to the theoretical fracture strength, which indicates that surface or volume defects, if present, play only a minor role in fracture initiation.
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