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  • Title: X-ray diffraction structure analysis of MCM-48 mesoporous silica.
    Author: Solovyov LA, Belousov OV, Dinnebier RE, Shmakov AN, Kirik SD.
    Journal: J Phys Chem B; 2005 Mar 03; 109(8):3233-7. PubMed ID: 16851346.
    Abstract:
    The structure of MCM-48 mesoporous silicate materials has been fully characterized from X-ray diffraction data by applying recently developed methods of mesostructure analysis and full-profile refinement. The pore wall thickness of both as-made and calcined MCM-48 was determined with high precision to be 8.0(1) Angstrom. No regular variations of the wall thickness were detected, but its density was found to be ca. 10% higher in the low-curvature regions. The surfactant density in the pores was assessed around 0.6-0.7 g/cm(3) and was found to have a distinct minimum in the pore center similar to that detected previously in MCM-41. A new extended model function of the density distribution in MCM-48 is proposed on the basis of the structural features that were revealed.
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