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  • Title: Amorphous selenium flat panel detectors for digital mammography: validation of a NPWE model observer with CDMAM observer performance experiments.
    Author: Segui JA, Zhao W.
    Journal: Med Phys; 2006 Oct; 33(10):3711-22. PubMed ID: 17089837.
    Abstract:
    Model observers have been developed which incorporate a specific imaging task, system performance, and human observer characteristics and can potentially overcome some of the limitations in using detective quantum efficiency for optimization and comparison of detectors. In this paper, a modified nonprewhitening matched filter (NPWE) model observer was developed and validated to predict object detectability for an amorphous selenium (a-Se) direct flat-panel imager (FPI) where aliasing is severe. A preclinical a-Se digital mammography FPI with 85 microm pixel size was used in this investigation. Its physical imaging properties including modulation transfer function (MTF), noise power spectrum, and DQE were fully characterized. An observer performance study was conducted by imaging the CDMAM 3.4 contrast-detail phantom designed specifically for digital mammography and presenting these images to a panel of seven observers. X-ray attenuation and scatter due to the phantom were determined experimentally for use in development of the model observer. The observer study results were analyzed via threshold averaging and signal detection theory (SDT) based techniques to produce contrast-detail curves where threshold contrast is plotted as a function of disk diameter. Validity of the model was established using SDT analysis of the experimental data. The effect of aliasing on the detectability of small diameter disks was determined using the NPWE model observer. The signal spectrum was calculated using the presampling MTF of the detector with and without including the aliased terms. Our results indicate that the NPWE model based on Fourier domain parameters provides reasonable prediction of object detectability for the signal-known-exactly task in uniform image noise for a-Se direct FPI.
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