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  • Title: Interferometry based technique for intensity profile measurements of far IR beams.
    Author: Soloviev AA, Khazanov EA, Kozhevatov IE, Palashov OV.
    Journal: Appl Opt; 2007 Jun 20; 46(18):3821-8. PubMed ID: 17538679.
    Abstract:
    We present a novel, to the best of our knowledge, method for measuring the intensity profile of far-IR beams. The method is based on the measurements of nonstationary variation in optical thickness of a fused-silica plate heated by the studied radiation. The optical thickness is observed by means of a reflecting interferometer. Purpose-made experimental setup allows one to measure beams with an aperture of up to 60 mm with a spatial resolution of 1 mm. The accessibility of the utilized technologies and the possibility to easily increase the aperture are the major advantages of this approach. The probable area of application for the method is measurements of beams produced by powerful industrial far-IR lasers.
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