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Pubmed for Handhelds

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  • Title: Invited review article: a review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements.
    Author: Gan Y.
    Journal: Rev Sci Instrum; 2007 Aug; 78(8):081101. PubMed ID: 17764306.
    Abstract:
    Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.
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