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  • Title: Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.
    Author: Giessibl FJ.
    Journal: Science; 1995 Jan 06; 267(5194):68-71. PubMed ID: 17840059.
    Abstract:
    Achieving high resolution under ultrahigh-vacuum conditions with the force microscope can be difficult for reactive surfaces, where the interaction forces between the tip and the samples can be relatively large. A force detection scheme that makes use of a modified cantilever beam and senses the force gradient through frequency modulation is described. The reconstructed silicon (111)-(7x7) surface was imaged in a noncontact mode by force microscopy with atomic resolution (6 angstroms lateral, 0.1 angstrom vertical).
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