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  • Title: THz emission microscopy with sub-wavelength broadband source.
    Author: Lecaque R, Grésillon S, Boccara C.
    Journal: Opt Express; 2008 Mar 31; 16(7):4731-8. PubMed ID: 18542570.
    Abstract:
    A versatile THz/IR near field microscope is demonstrated. Collecting the scattered light from a THz in-situ subwavelength source, this microscope provides images with resolution better than lambda/10. The physical origin of the contrast is explained by a Mie scattering diffraction model. Owing to the classical nature of this microscope working in the near field, resolution of THz/IR images is improved using deconvolution process.
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