These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


Pubmed for Handhelds

PUBMED FOR HANDHELDS

Search MEDLINE/PubMed

  • Title: The effect of masker spectral asymmetry on overshoot in simultaneous masking.
    Author: Schmidt S, Zwicker E.
    Journal: J Acoust Soc Am; 1991 Mar; 89(3):1324-30. PubMed ID: 2030219.
    Abstract:
    "Overshoot" is a simultaneous masking phenomenon: Thresholds for short high-frequency tone bursts presented shortly after the onset of a broadband masker are raised compared to thresholds in the presence of a continuous masker. Overshoot for 2-ms bursts of a 5000-Hz test tone is described for four subjects as a function of the spectral composition and level of the masker. First, it was verified that overshoot is largely independent of masker duration. Second, overshoot was determined for a variety of 10-ms masker bursts composed of differently filtered uniform masking noise with an overall level of 60 dB SPL: unfiltered, high-pass (cutoff at 3700 Hz), low-pass (cutoff at 5700 Hz), and third-octave-band-(centered at 5000 Hz) filtered uniform masking noises presented separately or combined with different bandpass maskers (5700-16000 Hz, 5700-9500 Hz, 8400-16000 Hz) were used. Third, masked thresholds were measured for maskers composed of an upper or lower octave band adjacent to the third-octave-band masker as a function of the level of the octave band. All maskers containing components above the critical band of the test tone led to overshoot; no additional overshoot was produced by masker components below it. Typical values of overshoot were on the order of 12 dB. Overshoot saturated when masker levels were above 60 dB SPL for the upper octave-band masker. The standard neurophysiological explanation of overshoot accounts only partially for these data. Details that must be accommodated by any full explanation of overshoot are discussed.
    [Abstract] [Full Text] [Related] [New Search]