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Title: Negative differential resistance in carbon nanotube field-effect transistors with patterned gate oxide. Author: Rinkiö M, Johansson A, Kotimäki V, Törmä P. Journal: ACS Nano; 2010 Jun 22; 4(6):3356-62. PubMed ID: 20524681. Abstract: We demonstrate controllable and gate-tunable negative differential resistance in carbon nanotube field-effect transistors, at room temperature and at 4.2 K. This is achieved by effectively creating quantum dots along the carbon nanotube channel by patterning the underlying, high-kappa gate oxide. The negative differential resistance feature can be modulated by both the gate and the drain-source voltage, which leads to more than 20% change of the current peak-to-valley ratio. Our approach is fully scalable and opens up a possibility for a new class of nanoscale electronic devices using negative differential resistance in their operation.[Abstract] [Full Text] [Related] [New Search]