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  • Title: Atomic resolution imaging of grain boundary defects in monolayer chemical vapor deposition-grown hexagonal boron nitride.
    Author: Gibb AL, Alem N, Chen JH, Erickson KJ, Ciston J, Gautam A, Linck M, Zettl A.
    Journal: J Am Chem Soc; 2013 May 08; 135(18):6758-61. PubMed ID: 23550733.
    Abstract:
    Grain boundaries are observed and characterized in chemical vapor deposition-grown sheets of hexagonal boron nitride (h-BN) via ultra-high-resolution transmission electron microscopy at elevated temperature. Five- and seven-fold defects are readily observed along the grain boundary. Dynamics of strained regions and grain boundary defects are resolved. The defect structures and the resulting out-of-plane warping are consistent with recent theoretical model predictions for grain boundaries in h-BN.
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