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  • Title: Practical phase identification by convergent beam electron diffraction.
    Author: Mansfield J.
    Journal: J Electron Microsc Tech; 1989 Sep; 13(1):3-15. PubMed ID: 2778525.
    Abstract:
    The purpose of this article is to present a practical guide to the identification of phases in the analytical electron microscope with the aid of convergent beam electron diffraction. There is included a step-by-step approach to phase analysis, from the possible choices of the form of the specimen through how to explore reciprocal space in order to perform a full phase identification, either by symmetry analysis or by simple comparison of a pattern observed in the microscope with a previously recorded pattern (fingerprinting). There is a strong emphasis on practical hints and useful shortcuts.
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