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Title: Substrate-induced strain in 2D layered GaSe materials grown by molecular beam epitaxy. Author: Liu CW, Dai JJ, Wu SK, Diep NQ, Huynh SH, Mai TT, Wen HC, Yuan CT, Chou WC, Shen JL, Luc HH. Journal: Sci Rep; 2020 Jul 31; 10(1):12972. PubMed ID: 32737426. Abstract: Two-dimensional (2D) layered GaSe films were grown on GaAs (001), GaN/Sapphire, and Mica substrates by molecular beam epitaxy (MBE). The in situ reflective high-energy electron diffraction monitoring reveals randomly in-plane orientations of nucleated GaSe layers grown on hexagonal GaN/Sapphire and Mica substrates, whereas single-orientation GaSe domain is predominant in the GaSe/GaAs (001) sample. Strong red-shifts in the frequency of in-plane [Formula: see text] vibration modes and bound exciton emissions observed from Raman scattering and photoluminescence spectra in all samples are attributed to the unintentionally biaxial in-plane tensile strains, induced by the dissimilarity of symmetrical surface structure between the 2D-GaSe layers and the substrates during the epitaxial growth. The results in this study provide an important understanding of the MBE-growth process of 2D-GaSe on 2D/3D hybrid-heterostructures and pave the way in strain engineering and optical manipulation of 2D layered GaSe materials for novel optoelectronic integrated technologies.[Abstract] [Full Text] [Related] [New Search]