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Title: Structural analysis of extracellular matrix prior to the migration of cephalic neural crest cells. Author: Bolender DL, Seliger WG, Markwald RR, Brauer PR. Journal: Scan Electron Microsc; 1981; (Pt 2):285-96. PubMed ID: 7034169. Abstract: Cephalic neural crest cells enter cell free areas containing abundant extracellular matrix (ECM). Previous histochemical studies have identified both sulfated and non-sulfated glycosaminoglycans within this matrix. In the present study, ultrastructural examination of the ECM demonstrated an anastomosing network of pleomorphic, cetyl pyridinium chloride-dependent strands within cell free spaces and in association with the basement membrane of the surface ectoderm. Thin section analysis revealed that the strands consisted of three components: (1) 3-5 nm filament meshwork; (2) electron dense amorphous material and (3) 30 nm granules. In contrast, the ECM associated with the basement membrane consisted principally of a continuum of electron dense, amorphous material. The molecular ordering of ECM within crest cell pathways was compared to the well-characterized, hyaluronate-rich, premigratory matrix of cardiac jelly.[Abstract] [Full Text] [Related] [New Search]