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Journal Abstract Search

211 related items for PubMed ID: 10420176

  • 1. Accurate structure refinement and measurement of crystal charge distribution using convergent beam electron diffraction.
    Zuo JM.
    Microsc Res Tech; 1999 Aug 01; 46(3):220-33. PubMed ID: 10420176
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  • 3. Charge density determination in icosahedral AlPdMn quasicrystal using quantitative convergent beam electron diffraction.
    Yu F, Zou H, Wang J, Wang R.
    Micron; 2004 Aug 01; 35(6):411-8. PubMed ID: 15120124
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  • 6. Measurement of crystal thickness and crystal tilt from HRTEM images and a way to correct for their effects.
    Hovmöller S, Zou X.
    Microsc Res Tech; 1999 Aug 01; 46(3):147-59. PubMed ID: 10420172
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  • 7. Convergent-beam electron diffraction.
    Tanaka M, Tsuda K.
    J Electron Microsc (Tokyo); 2011 Aug 01; 60 Suppl 1():S245-67. PubMed ID: 21844594
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  • 10. Extinction-free electron diffraction refinement of bonding in SrTiO3.
    Friis J, Jiang B, Spence J, Marthinsen K, Holmestad R.
    Acta Crystallogr A; 2004 Sep 01; 60(Pt 5):402-8. PubMed ID: 15477678
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  • 11. Measurement of lattice parameter and strain using convergent beam electron diffraction.
    Randle V, Barker I, Ralph B.
    J Electron Microsc Tech; 1989 Sep 01; 13(1):51-65. PubMed ID: 2674367
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  • 13. Progress toward structure determination.
    Gjønnes J, Olsen A, Matsuhata H.
    J Electron Microsc Tech; 1989 Oct 01; 13(2):98-110. PubMed ID: 2809771
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  • 14. Prospects for the direct electron crystallographic determination of zeolite structures.
    Dorset DL, McCourt MP.
    Microsc Res Tech; 1997 Feb 01; 36(3):212-23. PubMed ID: 9080411
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  • 15. A study of charge density in copper.
    Friis J, Jiang B, Marthinsen K, Holmestad R.
    Acta Crystallogr A; 2005 Mar 01; 61(Pt 2):223-30. PubMed ID: 15724072
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  • 17. On the application of an experimental multipolar pseudo-atom library for accurate refinement of small-molecule and protein crystal structures.
    Zarychta B, Pichon-Pesme V, Guillot B, Lecomte C, Jelsch C.
    Acta Crystallogr A; 2007 Mar 01; 63(Pt 2):108-25. PubMed ID: 17301471
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  • 18. On the phase problem in electron microscopy: the relationship between structure factors, exit waves, and HREM images.
    Zou X.
    Microsc Res Tech; 1999 Aug 01; 46(3):202-19. PubMed ID: 10420175
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  • 19. Strain analysis of Si by FEM and energy-filtering CBED.
    Okuyama T, Nakayama M, Tomokiyo Y, Van Der Biest O.
    Microsc Microanal; 2002 Feb 01; 8(1):11-5. PubMed ID: 12533199
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  • 20. A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns.
    Nakashima PN, Moodie AF, Etheridge J.
    Ultramicroscopy; 2011 Jun 01; 111(7):841-6. PubMed ID: 21664549
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