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Journal Abstract Search

185 related items for PubMed ID: 12641753

  • 1. Fabrication of near-field optical apertures in aluminium by a highly selective corrosion process in the evanescent field.
    Haefliger D, Stemmer A.
    J Microsc; 2003 Mar; 209(Pt 3):150-4. PubMed ID: 12641753
    [Abstract] [Full Text] [Related]

  • 2. Writing subwavelength-sized structures into aluminium films by thermo-chemical aperture-less near-field optical microscopy.
    Haefliger D, Stemmer A.
    Ultramicroscopy; 2004 Aug; 100(3-4):457-64. PubMed ID: 15231339
    [Abstract] [Full Text] [Related]

  • 3. Characterization and fabrication of fully metal-coated scanning near-field optical microscopy SiO2 tips.
    Aeschimann L, Akiyama T, Staufer U, De Rooij NF, Thiery L, Eckert R, Heinzelmann H.
    J Microsc; 2003 Mar; 209(Pt 3):182-7. PubMed ID: 12641759
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  • 4. High resolution capabilities of all-silica cantilevered probes for near-field optical microscopy.
    Descrovi E, Aeschimann L, Soboleva I, De Angelis F, Giorgis F, Di Fabrizio E.
    J Nanosci Nanotechnol; 2009 Nov; 9(11):6460-4. PubMed ID: 19908549
    [Abstract] [Full Text] [Related]

  • 5. Photoplastic near-field optical probe with sub-100 nm aperture made by replication from a nanomould.
    Kim GM, Kim BJ, Ten Have ES, Segerink F, Van Hulst NF, Brugger J.
    J Microsc; 2003 Mar; 209(Pt 3):267-71. PubMed ID: 12641773
    [Abstract] [Full Text] [Related]

  • 6. Near-field imaging of surface plasmon on gold nano-dots fabricated by scanning probe lithography.
    Kim J, Kim J, Song KI, Lee SQ, Kim EU, Choi SE, Lee Y, Park KH.
    J Microsc; 2003 Mar; 209(Pt 3):236-40. PubMed ID: 12641768
    [Abstract] [Full Text] [Related]

  • 7. Quality assessment of atomic force microscopy probes by scanning electron microscopy: correlation of tip structure with rendered images.
    Taatjes DJ, Quinn AS, Lewis MR, Bovill EG.
    Microsc Res Tech; 1999 Mar 01; 44(5):312-26. PubMed ID: 10090206
    [Abstract] [Full Text] [Related]

  • 8. Characterization of uniformity and reproducibility of photoresist nanomasks fabricated by near-field scanning optical nanolithography.
    Kwon S, Jeong Y, Jeong S.
    J Nanosci Nanotechnol; 2006 Nov 01; 6(11):3647-51. PubMed ID: 17252829
    [Abstract] [Full Text] [Related]

  • 9. High-resolution constant-height imaging with apertured silicon cantilever probes.
    Dziomba T, Danzebrink HU, Lehrer C, Frey L, Sulzbach T, Ohlsson O.
    J Microsc; 2001 Apr 01; 202(Pt 1):22-7. PubMed ID: 11298864
    [Abstract] [Full Text] [Related]

  • 10. Topographic, electrochemical, and optical images captured using standing approach mode scanning electrochemical/optical microscopy.
    Takahashi Y, Hirano Y, Yasukawa T, Shiku H, Yamada H, Matsue T.
    Langmuir; 2006 Dec 05; 22(25):10299-306. PubMed ID: 17128996
    [Abstract] [Full Text] [Related]

  • 11. Batch fabrication of atomic force microscopy probes with recessed integrated ring microelectrodes at a wafer level.
    Shin H, Hesketh PJ, Mizaikoff B, Kranz C.
    Anal Chem; 2007 Jul 01; 79(13):4769-77. PubMed ID: 17521168
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  • 15. Apertureless scanning near-field optical microscopy for ion exchange channel waveguide characterization.
    Blaize S, Aubert S, Bruyant A, Bachelot R, Lerondel G, Royer P, Broquin JE, Minier V.
    J Microsc; 2003 Mar 01; 209(Pt 3):155-61. PubMed ID: 12641754
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  • 18. Breaking the diffraction barrier outside of the optical near-field with bright, collimated light from nanometric apertures.
    Stark PR, Halleck AE, Larson DN.
    Proc Natl Acad Sci U S A; 2007 Nov 27; 104(48):18902-6. PubMed ID: 18024583
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  • 19. Focussed ion beam machined cantilever aperture probes for near-field optical imaging.
    Jin EX, Xu X.
    J Microsc; 2008 Mar 27; 229(Pt 3):503-11. PubMed ID: 18331502
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