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209 related items for PubMed ID: 12672570

  • 1. Electron diffraction from nanovolumes of amorphous material using coherent convergent illumination.
    McBride W, Cockayne DJ, Nguyen-Manh D.
    Ultramicroscopy; 2003 Aug; 96(2):191-200. PubMed ID: 12672570
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  • 3. Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel.
    Mitchell DR.
    J Microsc; 2006 Nov; 224(Pt 2):187-96. PubMed ID: 17204066
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  • 5. Low-dose performance of parallel-beam nanodiffraction.
    Malac M, Beleggia M, Taniguchi Y, Egerton RF, Zhu Y.
    Ultramicroscopy; 2008 Dec; 109(1):14-21. PubMed ID: 18768263
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  • 6. Coherent electron interference from amorphous TEM specimens.
    Herring RA, Saitoh K, Tanaka N, Tanji T.
    J Electron Microsc (Tokyo); 2010 Dec; 59(5):321-9. PubMed ID: 20511216
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  • 8. Influence of the elliptical illumination on acquisition and correction of coherent aberrations in high-resolution electron holography.
    Lehmann M.
    Ultramicroscopy; 2004 Jul; 100(1-2):9-23. PubMed ID: 15219689
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  • 9. Quantitative evaluation of process induced strain in MOS transistors by Convergent Beam Electron Diffraction.
    Clement L, Cacho F, Pantel R, Rouviere JL.
    Micron; 2009 Dec; 40(8):886-93. PubMed ID: 19589685
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  • 10. Lattice-resolution contrast from a focused coherent electron probe. Part I.
    Allen LJ, Findlay SD, Oxley MP, Rossouw CJ.
    Ultramicroscopy; 2003 Jul; 96(1):47-63. PubMed ID: 12623171
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  • 14. Practical phase identification by convergent beam electron diffraction.
    Mansfield J.
    J Electron Microsc Tech; 1989 Sep; 13(1):3-15. PubMed ID: 2778525
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  • 15. The effect of inelastic scattering on crystal structure refinement from electron diffraction patterns recorded under almost parallel illumination.
    Jansen J, Zandbergen HW, Otten MT.
    Ultramicroscopy; 2004 Jan; 98(2-4):165-72. PubMed ID: 15046796
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  • 16. Role of surface amorphous film in high-resolution high-angle annular dark field STEM imaging.
    Yamazaki T, Watanabe K, Nakanishi N, Hashimoto I.
    Ultramicroscopy; 2004 May; 99(2-3):125-35. PubMed ID: 15093939
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