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200 related items for PubMed ID: 14523520
21. Fine scale genetic and physical mapping using interstitial deletion mutants of Lr34 /Yr18: a disease resistance locus effective against multiple pathogens in wheat. Spielmeyer W, Singh RP, McFadden H, Wellings CR, Huerta-Espino J, Kong X, Appels R, Lagudah ES. Theor Appl Genet; 2008 Feb; 116(4):481-90. PubMed ID: 18074114 [Abstract] [Full Text] [Related]
22. Quantitative trait loci for non-race-specific, high-temperature adult-plant resistance to stripe rust in wheat cultivar Express. Lin F, Chen XM. Theor Appl Genet; 2009 Feb; 118(4):631-42. PubMed ID: 18815766 [Abstract] [Full Text] [Related]
23. QTL mapping for adult-plant resistance to stripe rust in Italian common wheat cultivars Libellula and Strampelli. Lu Y, Lan C, Liang S, Zhou X, Liu D, Zhou G, Lu Q, Jing J, Wang M, Xia X, He Z. Theor Appl Genet; 2009 Nov; 119(8):1349-59. PubMed ID: 19756474 [Abstract] [Full Text] [Related]
24. Mapping of Quantitative Trait Loci for Leaf Rust Resistance in the Wheat Population Ning7840 × Clark. Li C, Wang Z, Li C, Bowden R, Bai G, Li C, Li C, Su Z, Carver BF. Plant Dis; 2017 Dec; 101(12):1974-1979. PubMed ID: 30677381 [Abstract] [Full Text] [Related]
25. Inheritance of field resistance to Stagonospora nodorum leaf and glume blotch and correlations with other morphological traits in hexaploid wheat (Triticum aestivum L.). Aguilar V, Stamp P, Winzeler M, Winzeler H, Schachermayr G, Keller B, Zanetti S, Messmer MM. Theor Appl Genet; 2005 Jul; 111(2):325-36. PubMed ID: 15895203 [Abstract] [Full Text] [Related]
35. Characterization of Quantitative Trait Loci for Leaf Rust Resistance from CI 13227 in Three Winter Wheat Populations. Zhao L, Lu Y, Zhang X, Zhao W, Xu X, Wang H, Zhang G, Fritz AK, Fellers J, Guttieri M, Jordan KW, Bai G. Phytopathology; 2024 Aug; 114(8):1869-1877. PubMed ID: 38829930 [Abstract] [Full Text] [Related]
40. Mapping of quantitative trait loci for leaf rust resistance in the wheat population 'Xinmai 26/Zhoumai 22'. Hou W, Lu Q, Ma L, Sun X, Wang L, Nie J, Guo P, Liu T, Li Z, Sun C, Ren Y, Wang X, Yang J, Chen F. J Exp Bot; 2023 May 19; 74(10):3019-3032. PubMed ID: 36879436 [Abstract] [Full Text] [Related] Page: [Previous] [Next] [New Search]