These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


Pubmed for Handhelds

PUBMED FOR HANDHELDS

Journal Abstract Search

321 related items for PubMed ID: 15046796

  • 21. Determination of unit cell.
    Ayer R.
    J Electron Microsc Tech; 1989 Sep; 13(1):16-26. PubMed ID: 2674366
    [Abstract] [Full Text] [Related]

  • 22. Techniques of convergent beam electron diffraction.
    Vincent R.
    J Electron Microsc Tech; 1989 Sep; 13(1):40-50. PubMed ID: 2778526
    [Abstract] [Full Text] [Related]

  • 23. Convergent-beam low energy electron diffraction (CBLEED) and the measurement of surface dipole layers.
    Spence JC, Poon HC, Saldin DK.
    Microsc Microanal; 2004 Feb; 10(1):128-33. PubMed ID: 15306076
    [Abstract] [Full Text] [Related]

  • 24. Direct space structure solution from precession electron diffraction data: Resolving heavy and light scatterers in Pb(13)Mn(9)O(25).
    Hadermann J, Abakumov AM, Tsirlin AA, Filonenko VP, Gonnissen J, Tan H, Verbeeck J, Gemmi M, Antipov EV, Rosner H.
    Ultramicroscopy; 2010 Jun; 110(7):881-90. PubMed ID: 20409638
    [Abstract] [Full Text] [Related]

  • 25. Extinction-free electron diffraction refinement of bonding in SrTiO3.
    Friis J, Jiang B, Spence J, Marthinsen K, Holmestad R.
    Acta Crystallogr A; 2004 Sep; 60(Pt 5):402-8. PubMed ID: 15477678
    [Abstract] [Full Text] [Related]

  • 26. Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques.
    Oleshko VP, Gijbels RH, Van Daele AJ, Jacob WA, Xu YE, Wang SE, Park IY, Kang TS.
    Microsc Res Tech; 1998 Jul 15; 42(2):108-22. PubMed ID: 9728882
    [Abstract] [Full Text] [Related]

  • 27. Coherent inelastic scattering in Si and TiAl.
    Moodie AF, Colson TA, Whitfield HJ.
    Ultramicroscopy; 2004 Nov 15; 101(2-4):247-55. PubMed ID: 15450670
    [Abstract] [Full Text] [Related]

  • 28. On the formation mechanisms, spatial resolution and intensity of backscatter Kikuchi patterns.
    Zaefferer S.
    Ultramicroscopy; 2007 Nov 15; 107(2-3):254-66. PubMed ID: 17055170
    [Abstract] [Full Text] [Related]

  • 29. Dynamical effects of anisotropic inelastic scattering in electron backscatter diffraction.
    Winkelmann A.
    Ultramicroscopy; 2008 Nov 15; 108(12):1546-50. PubMed ID: 18583053
    [Abstract] [Full Text] [Related]

  • 30. rf streak camera based ultrafast relativistic electron diffraction.
    Musumeci P, Moody JT, Scoby CM, Gutierrez MS, Tran T.
    Rev Sci Instrum; 2009 Jan 15; 80(1):013302. PubMed ID: 19191429
    [Abstract] [Full Text] [Related]

  • 31. Aberration-compensated large-angle rocking-beam electron diffraction.
    Koch CT.
    Ultramicroscopy; 2011 Jun 15; 111(7):828-40. PubMed ID: 21227590
    [Abstract] [Full Text] [Related]

  • 32.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 33. Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF).
    Houdellier F, Hÿtch MJ.
    Ultramicroscopy; 2008 Feb 15; 108(3):285-94. PubMed ID: 18061351
    [Abstract] [Full Text] [Related]

  • 34. Structure of calcium aluminate decahydrate (CaAl2O4.10D2O) from neutron and X-ray powder diffraction data.
    Christensen AN, Lebech B, Sheptyakov D, Hanson JC.
    Acta Crystallogr B; 2007 Dec 15; 63(Pt 6):850-61. PubMed ID: 18004040
    [Abstract] [Full Text] [Related]

  • 35. Electron diffraction from nanovolumes of amorphous material using coherent convergent illumination.
    McBride W, Cockayne DJ, Nguyen-Manh D.
    Ultramicroscopy; 2003 Aug 15; 96(2):191-200. PubMed ID: 12672570
    [Abstract] [Full Text] [Related]

  • 36. Local structure studies of Fe-Nb-B metallic glasses using electron diffraction.
    Hirata A, Hirotsu Y, Ohkubo T, Matsubara E, Makino A.
    J Microsc; 2006 Sep 15; 223(Pt 3):191-4. PubMed ID: 17059527
    [Abstract] [Full Text] [Related]

  • 37. Ab-initio primitive cell parameters from single convergent-beam electron diffraction patterns: a converse route to the identification of microcrystals with electrons.
    Le Page Y.
    Microsc Res Tech; 1992 Apr 01; 21(2):158-65. PubMed ID: 1558984
    [Abstract] [Full Text] [Related]

  • 38. Electron atomic scattering factors, Debye-Waller factors and the optical potential for high-energy electron diffraction.
    Peng LM.
    J Electron Microsc (Tokyo); 2005 Jun 01; 54(3):199-207. PubMed ID: 16076864
    [Abstract] [Full Text] [Related]

  • 39. Absolute scattering probabilities for subexcitation electrons in condensed H2O.
    Bader G, Chiasson J, Caron LG, Michaud M, Perluzzo G, Sanche L.
    Radiat Res; 1988 Jun 01; 114(3):467-79. PubMed ID: 3375436
    [Abstract] [Full Text] [Related]

  • 40. Thickness difference: a new filtering tool for quantitative electron diffraction.
    Nakashima PN.
    Phys Rev Lett; 2007 Sep 21; 99(12):125506. PubMed ID: 17930519
    [Abstract] [Full Text] [Related]

    Page: [Previous] [Next] [New Search]
    of 17.