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Journal Abstract Search

308 related items for PubMed ID: 15231316

  • 1. Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs.
    Cumpson PJ, Zhdan P, Hedley J.
    Ultramicroscopy; 2004 Aug; 100(3-4):241-51. PubMed ID: 15231316
    [Abstract] [Full Text] [Related]

  • 2. Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI.
    Cumpson PJ, Hedley J.
    Nanotechnology; 2003 Dec; 14(12):1279-88. PubMed ID: 21444981
    [Abstract] [Full Text] [Related]

  • 3. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array.
    Gates RS, Reitsma MG.
    Rev Sci Instrum; 2007 Aug; 78(8):086101. PubMed ID: 17764361
    [Abstract] [Full Text] [Related]

  • 4. Influence of Poisson's ratio variation on lateral spring constant of atomic force microscopy cantilevers.
    Yeh MK, Tai NH, Chen BY.
    Ultramicroscopy; 2008 Sep; 108(10):1025-9. PubMed ID: 18547729
    [Abstract] [Full Text] [Related]

  • 5. Spring constant calibration of atomic force microscopy cantilevers with a piezosensor transfer standard.
    Langlois ED, Shaw GA, Kramar JA, Pratt JR, Hurley DC.
    Rev Sci Instrum; 2007 Sep; 78(9):093705. PubMed ID: 17902953
    [Abstract] [Full Text] [Related]

  • 6. Effects of anisotropic material property on the spring constant and the resonant frequency of atomic force microscope cantilever.
    Yeh MK, Tai NH, Chen BY.
    Rev Sci Instrum; 2009 Apr; 80(4):043705. PubMed ID: 19405664
    [Abstract] [Full Text] [Related]

  • 7. Quantitative nanotribology by AFM: a novel universal calibration platform.
    Tocha E, Schönherr H, Vancso GJ.
    Langmuir; 2006 Feb 28; 22(5):2340-50. PubMed ID: 16489827
    [Abstract] [Full Text] [Related]

  • 8. Calibration of atomic force microscope cantilevers using piezolevers.
    Aksu SB, Turner JA.
    Rev Sci Instrum; 2007 Apr 28; 78(4):043704. PubMed ID: 17477667
    [Abstract] [Full Text] [Related]

  • 9. Lateral force microscope calibration using a modified atomic force microscope cantilever.
    Reitsma MG.
    Rev Sci Instrum; 2007 Oct 28; 78(10):106102. PubMed ID: 17979458
    [Abstract] [Full Text] [Related]

  • 10. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties.
    Boudaoud M, Haddab Y, Le Gorrec Y, Lutz P.
    Rev Sci Instrum; 2012 Jan 28; 83(1):013704. PubMed ID: 22299959
    [Abstract] [Full Text] [Related]

  • 11. A method for atomic force microscopy cantilever stiffness calibration under heavy fluid loading.
    Kennedy SJ, Cole DG, Clark RL.
    Rev Sci Instrum; 2009 Dec 28; 80(12):125103. PubMed ID: 20059166
    [Abstract] [Full Text] [Related]

  • 12. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.
    Slattery AD, Blanch AJ, Quinton JS, Gibson CT.
    Ultramicroscopy; 2013 Aug 28; 131():46-55. PubMed ID: 23685172
    [Abstract] [Full Text] [Related]

  • 13. Accurate spring constant calibration for very stiff atomic force microscopy cantilevers.
    Grutzik SJ, Gates RS, Gerbig YB, Smith DT, Cook RF, Zehnder AT.
    Rev Sci Instrum; 2013 Nov 28; 84(11):113706. PubMed ID: 24289403
    [Abstract] [Full Text] [Related]

  • 14. A compact torsional reference device for easy, accurate and traceable AFM piconewton calibration.
    Portoles JF, Cumpson PJ.
    Nanotechnology; 2013 Aug 23; 24(33):335706. PubMed ID: 23892516
    [Abstract] [Full Text] [Related]

  • 15. Cantilever spring constant calibration using laser Doppler vibrometry.
    Ohler B.
    Rev Sci Instrum; 2007 Jun 23; 78(6):063701. PubMed ID: 17614610
    [Abstract] [Full Text] [Related]

  • 16. Tapping mode imaging and measurements with an inverted atomic force microscope.
    Chan SS, Green JB.
    Langmuir; 2006 Jul 18; 22(15):6701-6. PubMed ID: 16831016
    [Abstract] [Full Text] [Related]

  • 17. Optical lever calibration in atomic force microscope with a mechanical lever.
    Xie H, Vitard J, Haliyo S, Régnier S.
    Rev Sci Instrum; 2008 Sep 18; 79(9):096101. PubMed ID: 19044455
    [Abstract] [Full Text] [Related]

  • 18. Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers.
    Slattery AD, Blanch AJ, Quinton JS, Gibson CT.
    Nanotechnology; 2013 Jan 11; 24(1):015710. PubMed ID: 23220746
    [Abstract] [Full Text] [Related]

  • 19. Micro-wilhelmy and related liquid property measurements using constant-diameter nanoneedle-tipped atomic force microscope probes.
    Yazdanpanah MM, Hosseini M, Pabba S, Berry SM, Dobrokhotov VV, Safir A, Keynton RS, Cohn RW.
    Langmuir; 2008 Dec 02; 24(23):13753-64. PubMed ID: 18986184
    [Abstract] [Full Text] [Related]

  • 20. Accuracy of the spring constant of atomic force microscopy cantilevers by finite element method.
    Chen BY, Yeh MK, Tai NH.
    Anal Chem; 2007 Feb 15; 79(4):1333-8. PubMed ID: 17297931
    [Abstract] [Full Text] [Related]

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