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Journal Abstract Search

141 related items for PubMed ID: 15450670

  • 1. Coherent inelastic scattering in Si and TiAl.
    Moodie AF, Colson TA, Whitfield HJ.
    Ultramicroscopy; 2004 Nov; 101(2-4):247-55. PubMed ID: 15450670
    [Abstract] [Full Text] [Related]

  • 2. Aluminium phosphide as a eutectic grain nucleus in hypoeutectic Al-Si alloys.
    Nogita K, McDonald SD, Tsujimoto K, Yasuda K, Dahle AK.
    J Electron Microsc (Tokyo); 2004 Nov; 53(4):361-9. PubMed ID: 15585468
    [Abstract] [Full Text] [Related]

  • 3. The Hall-Petch law investigated by means of in situ straining experiments in lamellar TiAl and deformed Al.
    Caillard D, Couret A.
    Microsc Res Tech; 2009 Mar; 72(3):261-9. PubMed ID: 19156704
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  • 5. Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon.
    Winkelmann A, Nolze G.
    Ultramicroscopy; 2010 Feb; 110(3):190-4. PubMed ID: 20005045
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  • 7. The effect of inelastic scattering on crystal structure refinement from electron diffraction patterns recorded under almost parallel illumination.
    Jansen J, Zandbergen HW, Otten MT.
    Ultramicroscopy; 2004 Jan; 98(2-4):165-72. PubMed ID: 15046796
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  • 10. Evaluation of interface characterization and adhesion of glass ceramics to commercially pure titanium and gold alloy after thermal- and mechanical-loading.
    Vásquez VZ, Ozcan M, Kimpara ET.
    Dent Mater; 2009 Feb; 25(2):221-31. PubMed ID: 18718654
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  • 12. Photoassisted tuning of silicon nanocrystal photoluminescence.
    Choi J, Wang NS, Reipa V.
    Langmuir; 2007 Mar 13; 23(6):3388-94. PubMed ID: 17295527
    [Abstract] [Full Text] [Related]

  • 13. Nonthermal plasma synthesized freestanding silicon-germanium alloy nanocrystals.
    Pi XD, Kortshagen U.
    Nanotechnology; 2009 Jul 22; 20(29):295602. PubMed ID: 19567968
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  • 14. Absolute scattering probabilities for subexcitation electrons in condensed H2O.
    Bader G, Chiasson J, Caron LG, Michaud M, Perluzzo G, Sanche L.
    Radiat Res; 1988 Jun 22; 114(3):467-79. PubMed ID: 3375436
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  • 15. Megavoltage image contrast with low-atomic number target materials and amorphous silicon electronic portal imagers.
    Orton EJ, Robar JL.
    Phys Med Biol; 2009 Mar 07; 54(5):1275-89. PubMed ID: 19190362
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  • 16. Beam statistics and diffraction from materials in the critical state.
    Sellar JR.
    Microsc Microanal; 2004 Feb 07; 10(1):112-5. PubMed ID: 15306073
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  • 17. Lattice-resolution contrast from a focused coherent electron probe. Part I.
    Allen LJ, Findlay SD, Oxley MP, Rossouw CJ.
    Ultramicroscopy; 2003 Jul 07; 96(1):47-63. PubMed ID: 12623171
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  • 18. Mechanisms of decoherence in electron microscopy.
    Howie A.
    Ultramicroscopy; 2011 Jun 07; 111(7):761-7. PubMed ID: 20702040
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  • 19. EBIC study of electron generation function in a-Si:H.
    Najar S, Equer B.
    Microsc Res Tech; 1994 Aug 15; 28(6):527-34. PubMed ID: 7949398
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