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Pubmed for Handhelds

PUBMED FOR HANDHELDS

Journal Abstract Search

140 related items for PubMed ID: 1558984

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  • 7. Measurement of lattice parameter and strain using convergent beam electron diffraction.
    Randle V, Barker I, Ralph B.
    J Electron Microsc Tech; 1989 Sep; 13(1):51-65. PubMed ID: 2674367
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  • 14. Symmetry quantification and mapping using convergent beam electron diffraction.
    Kim KH, Zuo JM.
    Ultramicroscopy; 2013 Jan; 124():71-6. PubMed ID: 23142747
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  • 18. Accurate d-spacings from zero-order Laue zone patterns.
    Le Page Y.
    Microsc Res Tech; 1992 Nov 01; 23(3):243-7. PubMed ID: 1472752
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  • 20. Convergent-beam low energy electron diffraction (CBLEED) and the measurement of surface dipole layers.
    Spence JC, Poon HC, Saldin DK.
    Microsc Microanal; 2004 Feb 01; 10(1):128-33. PubMed ID: 15306076
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