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Journal Abstract Search

120 related items for PubMed ID: 15958013

  • 1. Characterization of polymer thin films by phase-sensitive acoustic microscopy and atomic force microscopy: a comparative review.
    Ngwa W, Luo W, Kamanyi A, Fomba KW, Grill W.
    J Microsc; 2005 Jun; 218(Pt 3):208-18. PubMed ID: 15958013
    [Abstract] [Full Text] [Related]

  • 2. Phase-sensitive acoustic microscopy of polymer thin films.
    Ngwa W, Wannemacher R, Grill W.
    Ultrasonics; 2004 Apr; 42(1-9):983-7. PubMed ID: 15047417
    [Abstract] [Full Text] [Related]

  • 3. Variable-force tapping atomic force microscopy as a tool in the characterization of organic devices.
    Iwasiewicz-Wabnig A, Shin JH, Xiao S, Edman L.
    Ultramicroscopy; 2007 Oct; 107(10-11):1078-85. PubMed ID: 17560029
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  • 4. Combined phase-sensitive acoustic microscopy and confocal laser scanning microscopy.
    Kamanyi A, Ngwa W, Betz T, Wannemacher R, Grill W.
    Ultrasonics; 2006 Dec 22; 44 Suppl 1():e1295-300. PubMed ID: 16806359
    [Abstract] [Full Text] [Related]

  • 5. 3-D morphological characterization of the liver parenchyma by atomic force microscopy and by scanning electron microscopy.
    Melling M, Karimian-Teherani D, Mostler S, Behnam M, Hochmeister S.
    Microsc Res Tech; 2004 May 01; 64(1):1-9. PubMed ID: 15287013
    [Abstract] [Full Text] [Related]

  • 6. Probing particle structure in waterborne pressure-sensitive adhesives with atomic force microscopy.
    Lei CH, Ouzineb K, Dupont O, Keddie JL.
    J Colloid Interface Sci; 2007 Mar 01; 307(1):56-63. PubMed ID: 17174966
    [Abstract] [Full Text] [Related]

  • 7. Application of atomic force microscopy as a nanotechnology tool in food science.
    Yang H, Wang Y, Lai S, An H, Li Y, Chen F.
    J Food Sci; 2007 May 01; 72(4):R65-75. PubMed ID: 17995783
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  • 12. Atomic force microscopy characterization of the chemical contrast of nanoscale patterns fabricated by electron beam lithography on polyethylene glycol oxide thin films.
    Sirghi L, Bretagnol F, Mornet S, Sasaki T, Gilliland D, Colpo P, Rossi F.
    Ultramicroscopy; 2009 Feb 01; 109(3):222-9. PubMed ID: 19121899
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  • 13. Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM.
    Bieletzki M, Hynninen T, Soini TM, Pivetta M, Henry CR, Foster AS, Esch F, Barth C, Heiz U.
    Phys Chem Chem Phys; 2010 Apr 07; 12(13):3203-9. PubMed ID: 20237710
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  • 15. Advances in phase-sensitive acoustic microscopy studies of polymer blend films: annealing effects and micro-elastic characterization of PS/PMMA blends.
    Kamanyi AE, Grill W, Ngwa W, Luo W.
    J Microsc; 2010 May 07; 238(2):134-44. PubMed ID: 20529061
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  • 16. Atomic force microscopy of Bacillus spore surface morphology.
    Zolock RA, Li G, Bleckmann C, Burggraf L, Fuller DC.
    Micron; 2006 May 07; 37(4):363-9. PubMed ID: 16376084
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  • 17. Characterizing the distribution of nonylphenol ethoxylate surfactants in water-based pressure-sensitive adhesive films using atomic-force and confocal Raman microscopy.
    Xu GH, Dong J, Zhang J, Severtson SJ, Houtman CJ, Gwin LE.
    J Phys Chem B; 2008 Sep 25; 112(38):11907-14. PubMed ID: 18767777
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  • 18. High-resolution noncontact atomic force microscopy.
    Pérez R, García R, Schwarz U.
    Nanotechnology; 2009 Jul 01; 20(26):260201. PubMed ID: 19531843
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  • 19. Mechanical characterization of polymeric thin films by atomic force microscopy based techniques.
    Passeri D, Rossi M, Tamburri E, Terranova ML.
    Anal Bioanal Chem; 2013 Feb 01; 405(5):1463-78. PubMed ID: 23052864
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  • 20. Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM).
    Alexeev A, Loos J, Koetse MM.
    Ultramicroscopy; 2006 Feb 01; 106(3):191-9. PubMed ID: 16125322
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