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Journal Abstract Search

129 related items for PubMed ID: 17291581

  • 1. Dynamic force microscopy imaging of plasmid DNA and viral RNA.
    Kienberger F, Costa LT, Zhu R, Kada G, Reithmayer M, Chtcheglova L, Rankl C, Pacheco AB, Thalhammer S, Pastushenko V, Heckl WM, Blaas D, Hinterdorfer P.
    Biomaterials; 2007 May; 28(15):2403-11. PubMed ID: 17291581
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  • 3. Effect of genomic long-range correlations on DNA persistence length: from theory to single molecule experiments.
    Moukhtar J, Faivre-Moskalenko C, Milani P, Audit B, Vaillant C, Fontaine E, Mongelard F, Lavorel G, St-Jean P, Bouvet P, Argoul F, Arneodo A.
    J Phys Chem B; 2010 Apr 22; 114(15):5125-43. PubMed ID: 20345170
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  • 5. Biophysical modeling of fragment length distributions of DNA plasmids after X and heavy-ion irradiation analyzed by atomic force microscopy.
    Elsässer T, Brons S, Psonka K, Scholz M, Gudowska-Nowak E, Taucher-Scholz G.
    Radiat Res; 2008 Jun 22; 169(6):649-59. PubMed ID: 18494540
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  • 6. Single molecule studies of RNA secondary structure: AFM of TYMV viral RNA.
    Giro A, Bergia A, Zuccheri G, Bink HH, Pleij CW, Samorì B.
    Microsc Res Tech; 2004 Nov 22; 65(4-5):235-45. PubMed ID: 15630685
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  • 9. [Visualization of the cruciform structure of superhelical DNA by use of atomic force microscopy].
    Limanskiĭ AP.
    Biofizika; 2000 Nov 22; 45(6):1039-43. PubMed ID: 11155230
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  • 11. The effect of drive frequency and set point amplitude on tapping forces in atomic force microscopy: simulation and experiment.
    Legleiter J.
    Nanotechnology; 2009 Jun 17; 20(24):245703. PubMed ID: 19471079
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  • 12. Interactive measurement and characterization of DNA molecules by analysis of AFM images.
    Marek J, Demjénová E, Tomori Z, Janácek J, Zolotová I, Valle F, Favre M, Dietler G.
    Cytometry A; 2005 Feb 17; 63(2):87-93. PubMed ID: 15648079
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  • 13. Fast contact-mode atomic force microscopy on biological specimen by model-based control.
    Schitter G, Stark RW, Stemmer A.
    Ultramicroscopy; 2004 Aug 17; 100(3-4):253-7. PubMed ID: 15231317
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  • 18. Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopy.
    Shegaonkar AC, Salapaka SM.
    Rev Sci Instrum; 2007 Oct 17; 78(10):103706. PubMed ID: 17979427
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