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Pubmed for Handhelds

PUBMED FOR HANDHELDS

Journal Abstract Search

340 related items for PubMed ID: 17614613

  • 1. Calibrating a tuning fork for use as a scanning probe microscope force sensor.
    Qin Y, Reifenberger R.
    Rev Sci Instrum; 2007 Jun; 78(6):063704. PubMed ID: 17614613
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  • 2. Measuring the interaction force between a tip and a substrate using a quartz tuning fork under ambient conditions.
    Qin Y, Reifenberger R.
    J Nanosci Nanotechnol; 2006 Nov; 6(11):3455-9. PubMed ID: 17252788
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  • 3. Dynamics of quartz tuning fork force sensors used in scanning probe microscopy.
    Castellanos-Gomez A, Agraït N, Rubio-Bollinger G.
    Nanotechnology; 2009 May 27; 20(21):215502. PubMed ID: 19423931
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  • 4. X-ray excited optical luminescence detection by scanning near-field optical microscope: a new tool for nanoscience.
    Larcheri S, Rocca F, Jandard F, Pailharey D, Graziola R, Kuzmin A, Purans J.
    Rev Sci Instrum; 2008 Jan 27; 79(1):013702. PubMed ID: 18248034
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  • 10. A technique for conditioning and calibrating force-sensing resistors for repeatable and reliable measurement of compressive force.
    Hall RS, Desmoulin GT, Milner TE.
    J Biomech; 2008 Dec 05; 41(16):3492-5. PubMed ID: 19019374
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  • 12. Mesoscale scanning probe tips with subnanometer rms roughness.
    Xu D, Liechti KM, Ravi-Chandar K.
    Rev Sci Instrum; 2007 Jul 05; 78(7):073707. PubMed ID: 17672766
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  • 17. Direct near-field optical imaging of UV bowtie nanoantennas.
    Zhou L, Gan Q, Bartoli FJ, Dierolf V.
    Opt Express; 2009 Oct 26; 17(22):20301-6. PubMed ID: 19997256
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  • 19. Highly efficient tip-enhanced Raman spectroscopy and microscopy of strained silicon.
    Tarun A, Hayazawa N, Motohashi M, Kawata S.
    Rev Sci Instrum; 2008 Jan 26; 79(1):013706. PubMed ID: 18248038
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  • 20. Lateral force microscope calibration using a modified atomic force microscope cantilever.
    Reitsma MG.
    Rev Sci Instrum; 2007 Oct 26; 78(10):106102. PubMed ID: 17979458
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