These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


Pubmed for Handhelds

PUBMED FOR HANDHELDS

Journal Abstract Search

317 related items for PubMed ID: 17764324

  • 1.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 2.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 3.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 4. Colloid probes with increased tip height for higher sensitivity in friction force microscopy and less cantilever damping in dynamic force microscopy.
    Schmutz JE, Schäfer MM, Hölscher H.
    Rev Sci Instrum; 2008 Feb; 79(2 Pt 1):026103. PubMed ID: 18315335
    [Abstract] [Full Text] [Related]

  • 5.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 6. High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopy.
    Cockins L, Miyahara Y, Stomp R, Grutter P.
    Rev Sci Instrum; 2007 Nov; 78(11):113706. PubMed ID: 18052479
    [Abstract] [Full Text] [Related]

  • 7.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 8. Direct measurement of cantilever spring constants and correction for cantilever irregularities using an instrumented indenter.
    Ying ZC, Reitsma MG, Gates RS.
    Rev Sci Instrum; 2007 Jun; 78(6):063708. PubMed ID: 17614617
    [Abstract] [Full Text] [Related]

  • 9. Large scan area high-speed atomic force microscopy using a resonant scanner.
    Zhao B, Howard-Knight JP, Humphris AD, Kailas L, Ratcliffe EC, Foster SJ, Hobbs JK.
    Rev Sci Instrum; 2009 Sep; 80(9):093707. PubMed ID: 19791944
    [Abstract] [Full Text] [Related]

  • 10.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 11.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 12.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 13.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 14. Suppression of spurious vibration of cantilever in atomic force microscopy by enhancement of bending rigidity of cantilever chip substrate.
    Tsuji T, Kobari K, Ide S, Yamanaka K.
    Rev Sci Instrum; 2007 Oct; 78(10):103703. PubMed ID: 17979424
    [Abstract] [Full Text] [Related]

  • 15.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 16.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 17.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 18. Control of tip-to-sample distance in atomic force microscopy: a dual-actuator tip-motion control scheme.
    Jeong Y, Jayanth GR, Menq CH.
    Rev Sci Instrum; 2007 Sep; 78(9):093706. PubMed ID: 17902954
    [Abstract] [Full Text] [Related]

  • 19.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 20.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

    Page: [Next] [New Search]
    of 16.