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Journal Abstract Search
626 related items for PubMed ID: 18558780
21. Influence of electrode size and geometry on electrochemical experiments with combined SECM-SFM probes. Pust SE, Salomo M, Oesterschulze E, Wittstock G. Nanotechnology; 2010 Mar 12; 21(10):105709. PubMed ID: 20160335 [Abstract] [Full Text] [Related]
22. Feedback-independent Pt nanoelectrodes for shear force-based constant-distance mode scanning electrochemical microscopy. Etienne M, Anderson EC, Evans SR, Schuhmann W, Fritsch I. Anal Chem; 2006 Oct 15; 78(20):7317-24. PubMed ID: 17037938 [Abstract] [Full Text] [Related]
24. Fabrication and characterization of a nanometer-sized optical fiber electrode based on selective chemical etching for scanning electrochemical/optical microscopy. Maruyama K, Ohkawa H, Ogawa S, Ueda A, Niwa O, Suzuki K. Anal Chem; 2006 Mar 15; 78(6):1904-12. PubMed ID: 16536427 [Abstract] [Full Text] [Related]
28. AFM colloidal forces measured between microscopic probes and flat substrates in nanoparticle suspensions. Drelich J, Long J, Xu Z, Masliyah J, Nalaskowski J, Beauchamp R, Liu Y. J Colloid Interface Sci; 2006 Sep 15; 301(2):511-22. PubMed ID: 16782121 [Abstract] [Full Text] [Related]
29. Mass transfer limitations at crystallizing interfaces in an atomic force microscopy fluid cell: a finite element analysis. Gasperino D, Yeckel A, Olmsted BK, Ward MD, Derby JJ. Langmuir; 2006 Jul 18; 22(15):6578-86. PubMed ID: 16831000 [Abstract] [Full Text] [Related]
30. Attachment of carbon nanotubes to atomic force microscope probes. Gibson CT, Carnally S, Roberts CJ. Ultramicroscopy; 2007 Oct 18; 107(10-11):1118-22. PubMed ID: 17644251 [Abstract] [Full Text] [Related]
31. Determination of solid surface tension from particle-substrate pull-off forces measured with the atomic force microscope. Drelich J, Tormoen GW, Beach ER. J Colloid Interface Sci; 2004 Dec 15; 280(2):484-97. PubMed ID: 15533421 [Abstract] [Full Text] [Related]
37. Integrated ultramicroelectrode-nanopipet probe for concurrent scanning electrochemical microscopy and scanning ion conductance microscopy. Comstock DJ, Elam JW, Pellin MJ, Hersam MC. Anal Chem; 2010 Feb 15; 82(4):1270-6. PubMed ID: 20073475 [Abstract] [Full Text] [Related]
38. A torsional resonance mode AFM for in-plane tip surface interactions. Huang L, Su C. Ultramicroscopy; 2004 Aug 15; 100(3-4):277-85. PubMed ID: 15231320 [Abstract] [Full Text] [Related]
39. Preventing nanoscale wear of atomic force microscopy tips through the use of monolithic ultrananocrystalline diamond probes. Liu J, Grierson DS, Moldovan N, Notbohm J, Li S, Jaroenapibal P, O'Connor SD, Sumant AV, Neelakantan N, Carlisle JA, Turner KT, Carpick RW. Small; 2010 May 21; 6(10):1140-9. PubMed ID: 20486220 [Abstract] [Full Text] [Related]