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Journal Abstract Search

170 related items for PubMed ID: 18601410

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  • 3. Force gradient sensitive detection in lift-mode Kelvin probe force microscopy.
    Ziegler D, Stemmer A.
    Nanotechnology; 2011 Feb 18; 22(7):075501. PubMed ID: 21233549
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  • 4. Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy.
    Palleau E, Ressier L, Borowik Ł, Mélin T.
    Nanotechnology; 2010 Jun 04; 21(22):225706. PubMed ID: 20453285
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  • 9. Direct probing of solvent-induced charge degradation in polypropylene electret fibres via electrostatic force microscopy.
    Kim J, Jasper W, Hinestroza J.
    J Microsc; 2007 Jan 04; 225(Pt 1):72-9. PubMed ID: 17286696
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  • 11. Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM.
    Bieletzki M, Hynninen T, Soini TM, Pivetta M, Henry CR, Foster AS, Esch F, Barth C, Heiz U.
    Phys Chem Chem Phys; 2010 Apr 07; 12(13):3203-9. PubMed ID: 20237710
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  • 15. Measurement of electrostatic tip-sample interactions by time-domain Kelvin probe force microscopy.
    Ritz C, Wagner T, Stemmer A.
    Beilstein J Nanotechnol; 2020 Apr 07; 11():911-921. PubMed ID: 32596095
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  • 17. Numerical study of the lateral resolution in electrostatic force microscopy for dielectric samples.
    Riedel C, Alegría A, Schwartz GA, Colmenero J, Sáenz JJ.
    Nanotechnology; 2011 Jul 15; 22(28):285705. PubMed ID: 21646694
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  • 19. Hydrogen-related contrast in atomic force microscopy.
    Schmidt R, Schwarz A, Wiesendanger R.
    Nanotechnology; 2009 Jul 01; 20(26):264007. PubMed ID: 19509454
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