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Journal Abstract Search

170 related items for PubMed ID: 18601410

  • 21. Tip-to-sample distance dependence of an electrostatic force in KFM measurements.
    Takahashi T, Ono S.
    Ultramicroscopy; 2004 Aug; 100(3-4):287-92. PubMed ID: 15231321
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  • 22. The assessment of microscopic charging effects induced by focused electron and ion beam irradiation of dielectrics.
    Stevens-Kalceff MA, Levick KJ.
    Microsc Res Tech; 2007 Mar; 70(3):195-204. PubMed ID: 17279517
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  • 23. An operating method with lateral scan for reducing the error in topography caused by the tip-sample angle in atomic force microscopy.
    Zhou FQ, Zhao XZ, Wang F, Wang YY.
    Microsc Microanal; 2010 Oct; 16(5):630-5. PubMed ID: 20731887
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  • 24. Electrostatic force spectroscopy on insulating surfaces: the effect of capacitive interaction.
    Takagi A, Yamada F, Matsumoto T, Kawai T.
    Nanotechnology; 2009 Sep 09; 20(36):365501. PubMed ID: 19687559
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  • 25. Magnetic exchange force microscopy with atomic resolution.
    Kaiser U, Schwarz A, Wiesendanger R.
    Nature; 2007 Mar 29; 446(7135):522-5. PubMed ID: 17392782
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  • 27. Influence of the carbon nanotube probe tilt angle on the effective probe stiffness and image quality in tapping-mode atomic force microscopy.
    Solares SD, Matsuda Y, Goddard WA.
    J Phys Chem B; 2005 Sep 08; 109(35):16658-64. PubMed ID: 16853119
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  • 36. Atomic contact potential variations of Si(111)-7 x 7 analyzed by Kelvin probe force microscopy.
    Kawai S, Glatzel T, Hug HJ, Meyer E.
    Nanotechnology; 2010 Jun 18; 21(24):245704. PubMed ID: 20484786
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  • 37. Practical aspects of single-pass scan Kelvin probe force microscopy.
    Li G, Mao B, Lan F, Liu L.
    Rev Sci Instrum; 2012 Nov 18; 83(11):113701. PubMed ID: 23206065
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