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633 related items for PubMed ID: 18657907

  • 1. In situ dynamic HR-TEM and EELS study on phase transitions of Ge2Sb2Te5 chalcogenides.
    Song SA, Zhang W, Sik Jeong H, Kim JG, Kim YJ.
    Ultramicroscopy; 2008 Oct; 108(11):1408-19. PubMed ID: 18657907
    [Abstract] [Full Text] [Related]

  • 2. First-principles study of nitrogen doping in cubic and amorphous Ge2Sb2Te5.
    Caravati S, Colleoni D, Mazzarello R, Kühne TD, Krack M, Bernasconi M, Parrinello M.
    J Phys Condens Matter; 2011 Jul 06; 23(26):265801. PubMed ID: 21673401
    [Abstract] [Full Text] [Related]

  • 3. Scanning electron microscope for in situ study of crystallization of Ge2Sb2Te5 in phase-change memory.
    Yin Y, Niida D, Ota K, Sone H, Hosaka S.
    Rev Sci Instrum; 2007 Dec 06; 78(12):126101. PubMed ID: 18163750
    [Abstract] [Full Text] [Related]

  • 4. Local electrical characterization of laser-recorded phase-change marks on amorphous Ge2Sb2Te5 thin films.
    Chang CM, Chu CH, Tseng ML, Chiang HP, Mansuripur M, Tsai DP.
    Opt Express; 2011 May 09; 19(10):9492-504. PubMed ID: 21643206
    [Abstract] [Full Text] [Related]

  • 5. Behaviour of TEM metal grids during in-situ heating experiments.
    Zhang Z, Su D.
    Ultramicroscopy; 2009 May 09; 109(6):766-74. PubMed ID: 19304394
    [Abstract] [Full Text] [Related]

  • 6. Electronic structure analyses of BN network materials using high energy-resolution spectroscopy methods based on transmission electron microscopy.
    Terauchi M.
    Microsc Res Tech; 2006 Jul 09; 69(7):531-7. PubMed ID: 16718665
    [Abstract] [Full Text] [Related]

  • 7. In situ investigation of thermally influenced phase transformations in (Pb 0.92 Sr 0.08)(Zr 0.65 Ti 0.35)O3 thin films using micro-Raman spectroscopy and X-ray diffraction.
    Sriram S, Bhaskaran M, Perova TS, Melnikov VA, Holland AS.
    IEEE Trans Ultrason Ferroelectr Freq Control; 2009 Feb 09; 56(2):241-5. PubMed ID: 19251510
    [Abstract] [Full Text] [Related]

  • 8. Structural evolution in boron nitrides during the hexagonal-cubic phase transition under high pressure at high temperature.
    He LL, Akaishi M, Horiuchi S.
    Microsc Res Tech; 1998 Feb 15; 40(4):243-50. PubMed ID: 9523758
    [Abstract] [Full Text] [Related]

  • 9. Room temperature amorphous to nanocrystalline transformation in ultra-thin films under tensile stress: an in situ TEM study.
    Manoharan MP, Kumar S, Haque MA, Rajagopalan R, Foley HC.
    Nanotechnology; 2010 Dec 17; 21(50):505707. PubMed ID: 21098951
    [Abstract] [Full Text] [Related]

  • 10. Order-order and order-disorder transitions in thin films of an amphiphilic liquid crystalline diblock copolymer.
    Yoon J, Jung SY, Ahn B, Heo K, Jin S, Iyoda T, Yoshida H, Ree M.
    J Phys Chem B; 2008 Jul 24; 112(29):8486-95. PubMed ID: 18588338
    [Abstract] [Full Text] [Related]

  • 11. In situ transmission electron microscopy study on Nb-doped Pb(Zr 0.95 Ti 0.05)O3 ceramics.
    Qu W, Tan X, Yang P.
    Microsc Res Tech; 2009 Mar 24; 72(3):216-22. PubMed ID: 19130612
    [Abstract] [Full Text] [Related]

  • 12. Structures of stable and metastable Ge2Sb2Te5, an intermetallic compound in GeTe-Sb2Te3 pseudobinary systems.
    Matsunaga T, Yamada N, Kubota Y.
    Acta Crystallogr B; 2004 Dec 24; 60(Pt 6):685-91. PubMed ID: 15534378
    [Abstract] [Full Text] [Related]

  • 13. Effect of Nitrogen Doping on the Crystallization Kinetics of Ge2Sb2Te5.
    Luong MA, Cherkashin N, Pecassou B, Sabbione C, Mazen F, Claverie A.
    Nanomaterials (Basel); 2021 Jun 30; 11(7):. PubMed ID: 34209198
    [Abstract] [Full Text] [Related]

  • 14. Transmission electron microscopy and X-Ray diffraction analysis of aluminum-induced crystallization of amorphous silicon in alpha-Si:H/Al and Al/alpha-Si:H structures.
    Kishore R, Hotz C, Naseem HA, Brown WD.
    Microsc Microanal; 2005 Apr 30; 11(2):133-7. PubMed ID: 15817142
    [Abstract] [Full Text] [Related]

  • 15. Structural stability and phase transitions in WO3 thin films.
    Ramana CV, Utsunomiya S, Ewing RC, Julien CM, Becker U.
    J Phys Chem B; 2006 Jun 01; 110(21):10430-5. PubMed ID: 16722749
    [Abstract] [Full Text] [Related]

  • 16. Growth rate determination through automated TEM image analysis: crystallization studies of doped SbTe phase-change thin films.
    Oosthoek JL, Kooi BJ, De Hosson JT, Wolters RA, Gravesteijn DJ, Attenborough K.
    Microsc Microanal; 2010 Jun 01; 16(3):291-9. PubMed ID: 20374680
    [Abstract] [Full Text] [Related]

  • 17. Electron beam irradiation induced crystallization behavior of amorphous Ge2Sb2Te5 chalcogenide material.
    An BS.
    Appl Microsc; 2019 Dec 17; 49(1):17. PubMed ID: 33580433
    [Abstract] [Full Text] [Related]

  • 18. Formation of crystalline silicon in kaolinite by electron beam irradiation and in situ heating in the HVEM.
    Lee S, Kim YM, Kim YJ.
    J Electron Microsc (Tokyo); 2007 Aug 17; 56(4):153-5. PubMed ID: 17951396
    [Abstract] [Full Text] [Related]

  • 19. Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates.
    Sriram S, Bhaskaran M, Mitchell DR, Short KT, Holland AS, Mitchell A.
    Microsc Microanal; 2009 Feb 17; 15(1):30-5. PubMed ID: 19144255
    [Abstract] [Full Text] [Related]

  • 20. The applications of in situ electron energy loss spectroscopy to the study of electron beam nanofabrication.
    Chen SJ, Howitt DG, Gierhart BC, Smith RL, Collins SD.
    Microsc Microanal; 2009 Jun 17; 15(3):204-12. PubMed ID: 19460176
    [Abstract] [Full Text] [Related]

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