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Journal Abstract Search

109 related items for PubMed ID: 19345495

  • 1. Improvement of KFM performance by intermittent bias application method and by sampling detection of cantilever deflection.
    Takahashi T, Matsumoto T, Ono S.
    Ultramicroscopy; 2009 Jul; 109(8):963-7. PubMed ID: 19345495
    [Abstract] [Full Text] [Related]

  • 2. Tip-to-sample distance dependence of an electrostatic force in KFM measurements.
    Takahashi T, Ono S.
    Ultramicroscopy; 2004 Aug; 100(3-4):287-92. PubMed ID: 15231321
    [Abstract] [Full Text] [Related]

  • 3. Kelvin probe force microscopy for conducting nanobits of NiO thin films.
    Son JY, Shin YH, Kim H, Cho JH, Jang H.
    Nanotechnology; 2010 May 28; 21(21):215704. PubMed ID: 20431198
    [Abstract] [Full Text] [Related]

  • 4. Multifrequency atomic force microscopy: compositional imaging with electrostatic force measurements.
    Magonov S, Alexander J.
    Microsc Microanal; 2011 Aug 28; 17(4):587-97. PubMed ID: 21771386
    [Abstract] [Full Text] [Related]

  • 5. Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy.
    Palleau E, Ressier L, Borowik Ł, Mélin T.
    Nanotechnology; 2010 Jun 04; 21(22):225706. PubMed ID: 20453285
    [Abstract] [Full Text] [Related]

  • 6. Kelvin force microscopy at the second cantilever resonance: an out-of-vacuum crosstalk compensation setup.
    Diesinger H, Deresmes D, Nys JP, Mélin T.
    Ultramicroscopy; 2008 Jul 04; 108(8):773-81. PubMed ID: 18342448
    [Abstract] [Full Text] [Related]

  • 7. Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy.
    Mélin T, Barbet S, Diesinger H, Théron D, Deresmes D.
    Rev Sci Instrum; 2011 Mar 04; 82(3):036101. PubMed ID: 21456803
    [Abstract] [Full Text] [Related]

  • 8. Direct probing of solvent-induced charge degradation in polypropylene electret fibres via electrostatic force microscopy.
    Kim J, Jasper W, Hinestroza J.
    J Microsc; 2007 Jan 04; 225(Pt 1):72-9. PubMed ID: 17286696
    [Abstract] [Full Text] [Related]

  • 9. On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy.
    Nony L, Bocquet F, Loppacher C, Glatzel T.
    Nanotechnology; 2009 Jul 01; 20(26):264014. PubMed ID: 19509441
    [Abstract] [Full Text] [Related]

  • 10. The influence of surface topography on Kelvin probe force microscopy.
    Sadewasser S, Leendertz C, Streicher F, Lux-Steiner MCh.
    Nanotechnology; 2009 Dec 16; 20(50):505503. PubMed ID: 19934483
    [Abstract] [Full Text] [Related]

  • 11. Electrostatic force spectroscopy on insulating surfaces: the effect of capacitive interaction.
    Takagi A, Yamada F, Matsumoto T, Kawai T.
    Nanotechnology; 2009 Sep 09; 20(36):365501. PubMed ID: 19687559
    [Abstract] [Full Text] [Related]

  • 12. AFM force mapping for characterizing patterns of electrostatic charges on SiO2 electrets.
    Zhang Y, Zhao D, Tan X, Cao T, Zhang X.
    Langmuir; 2010 Jul 20; 26(14):11958-62. PubMed ID: 20476727
    [Abstract] [Full Text] [Related]

  • 13. 3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: II. Rectangular shaped cantilevers with asymmetric pyramidal tips.
    Valdrè G, Moro D.
    Nanotechnology; 2008 Oct 08; 19(40):405502. PubMed ID: 21832618
    [Abstract] [Full Text] [Related]

  • 14. Measurement of electrostatic tip-sample interactions by time-domain Kelvin probe force microscopy.
    Ritz C, Wagner T, Stemmer A.
    Beilstein J Nanotechnol; 2020 Oct 08; 11():911-921. PubMed ID: 32596095
    [Abstract] [Full Text] [Related]

  • 15. Force gradient sensitive detection in lift-mode Kelvin probe force microscopy.
    Ziegler D, Stemmer A.
    Nanotechnology; 2011 Feb 18; 22(7):075501. PubMed ID: 21233549
    [Abstract] [Full Text] [Related]

  • 16. Direct measurement of tapping force with a cantilever deflection force sensor.
    Su C, Huang L, Kjoller K.
    Ultramicroscopy; 2004 Aug 18; 100(3-4):233-9. PubMed ID: 15231315
    [Abstract] [Full Text] [Related]

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  • 19. Surface potential switching by metal ion complexation/decomplexation using bipyridinethiolate monolayers on gold.
    Nakamura T, Koyama E, Shimoi Y, Abe S, Ishida T, Tsukagoshi K, Mizutani W, Tokuhisa H, Kanesato M, Nakai I, Kondoh H, Ohta T.
    J Phys Chem B; 2006 May 11; 110(18):9195-203. PubMed ID: 16671734
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