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220 related items for PubMed ID: 19957960

  • 1. Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions.
    Lee JL, Ninomiya S, Matsuo J, Gilmore IS, Seah MP, Shard AG.
    Anal Chem; 2010 Jan 01; 82(1):98-105. PubMed ID: 19957960
    [Abstract] [Full Text] [Related]

  • 2. Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.
    Shard AG, Havelund R, Seah MP, Spencer SJ, Gilmore IS, Winograd N, Mao D, Miyayama T, Niehuis E, Rading D, Moellers R.
    Anal Chem; 2012 Sep 18; 84(18):7865-73. PubMed ID: 22897795
    [Abstract] [Full Text] [Related]

  • 3. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams.
    Ninomiya S, Ichiki K, Yamada H, Nakata Y, Seki T, Aoki T, Matsuo J.
    Rapid Commun Mass Spectrom; 2009 Jun 18; 23(11):1601-6. PubMed ID: 19399762
    [Abstract] [Full Text] [Related]

  • 4. Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams.
    Ninomiya S, Ichiki K, Yamada H, Nakata Y, Seki T, Aoki T, Matsuo J.
    Rapid Commun Mass Spectrom; 2009 Oct 30; 23(20):3264-8. PubMed ID: 19757450
    [Abstract] [Full Text] [Related]

  • 5. Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size.
    Seah MP, Spencer SJ, Havelund R, Gilmore IS, Shard AG.
    Analyst; 2015 Oct 07; 140(19):6508-16. PubMed ID: 26325511
    [Abstract] [Full Text] [Related]

  • 6. Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS.
    Shard AG, Green FM, Brewer PJ, Seah MP, Gilmore IS.
    J Phys Chem B; 2008 Mar 06; 112(9):2596-605. PubMed ID: 18254619
    [Abstract] [Full Text] [Related]

  • 7. Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry.
    Wagner MS.
    Anal Chem; 2005 Feb 01; 77(3):911-22. PubMed ID: 15679361
    [Abstract] [Full Text] [Related]

  • 8. Cluster ion beam profiling of organics by secondary ion mass spectrometry--does sodium affect the molecular ion intensity at interfaces?
    Green FM, Gilmore IS, Seah MP.
    Rapid Commun Mass Spectrom; 2008 Dec 01; 22(24):4178-82. PubMed ID: 19039819
    [Abstract] [Full Text] [Related]

  • 9. TOF-SIMS with argon gas cluster ion beams: a comparison with C60+.
    Rabbani S, Barber AM, Fletcher JS, Lockyer NP, Vickerman JC.
    Anal Chem; 2011 May 15; 83(10):3793-800. PubMed ID: 21462969
    [Abstract] [Full Text] [Related]

  • 10. Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth Profiles.
    Havelund R, Seah MP, Gilmore IS.
    J Phys Chem B; 2016 Mar 10; 120(9):2604-11. PubMed ID: 26883085
    [Abstract] [Full Text] [Related]

  • 11. Sample cooling or rotation improves C60 organic depth profiles of multilayered reference samples: results from a VAMAS interlaboratory study.
    Sjövall P, Rading D, Ray S, Yang L, Shard AG.
    J Phys Chem B; 2010 Jan 21; 114(2):769-74. PubMed ID: 20020719
    [Abstract] [Full Text] [Related]

  • 12. Analysis of the interface and its position in C60(n+) secondary ion mass spectrometry depth profiling.
    Green FM, Shard AG, Gilmore IS, Seah MP.
    Anal Chem; 2009 Jan 01; 81(1):75-9. PubMed ID: 19117445
    [Abstract] [Full Text] [Related]

  • 13. Strongly reduced fragmentation and soft emission processes in sputtered ion formation from amino acid films under large Ar(n)+ (n ≤ 2200) cluster ion bombardment.
    Gnaser H, Ichiki K, Matsuo J.
    Rapid Commun Mass Spectrom; 2012 Jan 15; 26(1):1-8. PubMed ID: 22215571
    [Abstract] [Full Text] [Related]

  • 14. Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.
    Havelund R, Licciardello A, Bailey J, Tuccitto N, Sapuppo D, Gilmore IS, Sharp JS, Lee JL, Mouhib T, Delcorte A.
    Anal Chem; 2013 May 21; 85(10):5064-70. PubMed ID: 23590425
    [Abstract] [Full Text] [Related]

  • 15. Cluster secondary ion mass spectrometry and the temperature dependence of molecular depth profiles.
    Mao D, Wucher A, Brenes DA, Lu C, Winograd N.
    Anal Chem; 2012 May 01; 84(9):3981-9. PubMed ID: 22455606
    [Abstract] [Full Text] [Related]

  • 16. Depth resolution, angle dependence, and the sputtering yield of Irganox 1010 by coronene primary ions.
    Seah MP, Spencer SJ, Shard AG.
    J Phys Chem B; 2013 Oct 03; 117(39):11885-92. PubMed ID: 24010582
    [Abstract] [Full Text] [Related]

  • 17. Soft-sputtering of insulin films in argon-cluster secondary ion mass spectrometry.
    Oshima S, Kashihara I, Moritani K, Inui N, Mochiji K.
    Rapid Commun Mass Spectrom; 2011 Apr 30; 25(8):1070-4. PubMed ID: 21452384
    [Abstract] [Full Text] [Related]

  • 18. Dual beam organic depth profiling using large argon cluster ion beams.
    Holzweber M, Shard AG, Jungnickel H, Luch A, Unger W.
    Surf Interface Anal; 2014 Apr 30; 46(10-11):936-939. PubMed ID: 25892830
    [Abstract] [Full Text] [Related]

  • 19. Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60(+)-Ar(+) co-sputtering.
    Chang CJ, Chang HY, You YW, Liao HY, Kuo YT, Kao WL, Yen GJ, Tsai MH, Shyue JJ.
    Anal Chim Acta; 2012 Mar 09; 718():64-9. PubMed ID: 22305899
    [Abstract] [Full Text] [Related]

  • 20. Enhanced surface sensitivity in secondary ion mass spectrometric analysis of organic thin films using size-selected Ar gas-cluster ion projectiles.
    Tanaka M, Moritani K, Hirota T, Toyoda N, Yamada I, Inui N, Mochiji K.
    Rapid Commun Mass Spectrom; 2010 May 30; 24(10):1405-10. PubMed ID: 20411579
    [Abstract] [Full Text] [Related]

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