These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


PUBMED FOR HANDHELDS

Journal Abstract Search


187 related items for PubMed ID: 20431198

  • 1.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 2.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 3. NiO resistive random access memory nanocapacitor array on graphene.
    Son JY, Shin YH, Kim H, Jang HM.
    ACS Nano; 2010 May 25; 4(5):2655-8. PubMed ID: 20438101
    [Abstract] [Full Text] [Related]

  • 4. Self-formed exchange bias of switchable conducting filaments in NiO resistive random access memory capacitors.
    Son JY, Kim CH, Cho JH, Shin YH, Jang HM.
    ACS Nano; 2010 Jun 22; 4(6):3288-92. PubMed ID: 20433193
    [Abstract] [Full Text] [Related]

  • 5. Effects of a Nb nanopin electrode on the resistive random-access memory switching characteristics of NiO thin films.
    Ahn Y, Shin HW, Lee TH, Kim WH, Son JY.
    Nanoscale; 2018 Jul 19; 10(28):13443-13448. PubMed ID: 29972166
    [Abstract] [Full Text] [Related]

  • 6. Improvement of KFM performance by intermittent bias application method and by sampling detection of cantilever deflection.
    Takahashi T, Matsumoto T, Ono S.
    Ultramicroscopy; 2009 Jul 19; 109(8):963-7. PubMed ID: 19345495
    [Abstract] [Full Text] [Related]

  • 7. Electrostatic force microscopy study on the domain switching properties of the Pb(Zr0.2Ti0.8)O3 thin films with different crystallographic orientations for the probe-based data storage.
    Cho SM, Nam HJ, Park BH, Jeon DY.
    Ultramicroscopy; 2008 Sep 19; 108(10):1081-5. PubMed ID: 18562113
    [Abstract] [Full Text] [Related]

  • 8.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 9.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 10. AFM force mapping for characterizing patterns of electrostatic charges on SiO2 electrets.
    Zhang Y, Zhao D, Tan X, Cao T, Zhang X.
    Langmuir; 2010 Jul 20; 26(14):11958-62. PubMed ID: 20476727
    [Abstract] [Full Text] [Related]

  • 11.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 12. Nanoscale measurements of conducting domains and current-voltage characteristics of chemically deposited polyaniline films.
    Wu CG, Chang SS.
    J Phys Chem B; 2005 Jan 20; 109(2):825-32. PubMed ID: 16866448
    [Abstract] [Full Text] [Related]

  • 13. Improvement of resistive switching characteristics in ZrO2 film by embedding a thin TiOx layer.
    Li Y, Long S, Lv H, Liu Q, Wang Y, Zhang S, Lian W, Wang M, Zhang K, Xie H, Liu S, Liu M.
    Nanotechnology; 2011 Jun 24; 22(25):254028. PubMed ID: 21572216
    [Abstract] [Full Text] [Related]

  • 14. Probing the Ionic and Electrochemical Phenomena during Resistive Switching of NiO Thin Films.
    Lu W, Xiao J, Wong LM, Wang S, Zeng K.
    ACS Appl Mater Interfaces; 2018 Mar 07; 10(9):8092-8101. PubMed ID: 29424523
    [Abstract] [Full Text] [Related]

  • 15. Spray deposition and characterization of nanostructured Li doped NiO thin films for application in dye-sensitized solar cells.
    Paul Joseph D, Saravanan M, Muthuraaman B, Renugambal P, Sambasivam S, Philip Raja S, Maruthamuthu P, Venkateswaran C.
    Nanotechnology; 2008 Dec 03; 19(48):485707. PubMed ID: 21836314
    [Abstract] [Full Text] [Related]

  • 16. Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals.
    Glatzel T, Zimmerli L, Koch S, Such B, Kawai S, Meyer E.
    Nanotechnology; 2009 Jul 01; 20(26):264016. PubMed ID: 19509456
    [Abstract] [Full Text] [Related]

  • 17. Nonvolatile memory properties of Pt nanoparticle-embedded TiO(2) nanocomposite multilayers via electrostatic layer-by-layer assembly.
    Lee C, Kim I, Shin H, Kim S, Cho J.
    Nanotechnology; 2010 May 07; 21(18):185704. PubMed ID: 20378950
    [Abstract] [Full Text] [Related]

  • 18.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 19.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]

  • 20.
    ; . PubMed ID:
    [No Abstract] [Full Text] [Related]


    Page: [Next] [New Search]
    of 10.