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Journal Abstract Search

175 related items for PubMed ID: 20484786

  • 21. Coupled lateral bending-torsional vibration sensitivity of atomic force microscope cantilever.
    Lee HL, Chang WJ.
    Ultramicroscopy; 2008 Jul; 108(8):707-11. PubMed ID: 18054438
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  • 23. Measuring the charge state of an adatom with noncontact atomic force microscopy.
    Gross L, Mohn F, Liljeroth P, Repp J, Giessibl FJ, Meyer G.
    Science; 2009 Jun 12; 324(5933):1428-31. PubMed ID: 19520956
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  • 25. The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface.
    Naitoh Y, Kinoshita Y, Jun Li Y, Kageshima M, Sugawara Y.
    Nanotechnology; 2009 Jul 01; 20(26):264011. PubMed ID: 19509444
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  • 26. High spatial resolution Kelvin probe force microscopy with coaxial probes.
    Brown KA, Satzinger KJ, Westervelt RM.
    Nanotechnology; 2012 Mar 23; 23(11):115703. PubMed ID: 22369870
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  • 27. Influence of the macroscopic shape of the tip on the contrast in scanning polarization force microscopy images.
    Sacha GM, Cardellach M, Segura JJ, Moser J, Bachtold A, Fraxedas J, Verdaguer A.
    Nanotechnology; 2009 Jul 15; 20(28):285704. PubMed ID: 19550016
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  • 28. Local work function on graphene nanoribbons.
    Rothhardt D, Kimouche A, Klamroth T, Hoffmann-Vogel R.
    Beilstein J Nanotechnol; 2024 Jul 15; 15():1125-1131. PubMed ID: 39224533
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  • 29. Development of eddy current microscopy for high resolution electrical conductivity imaging using atomic force microscopy.
    Nalladega V, Sathish S, Jata KV, Blodgett MP.
    Rev Sci Instrum; 2008 Jul 15; 79(7):073705. PubMed ID: 18681706
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  • 32. Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques.
    Burke SA, LeDue JM, Miyahara Y, Topple JM, Fostner S, Grütter P.
    Nanotechnology; 2009 Jul 01; 20(26):264012. PubMed ID: 19509452
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  • 33. Spectroscopy of the shear force interaction in scanning near-field optical microscopy.
    Hoppe S, Ctistis G, Paggel JJ, Fumagalli P.
    Ultramicroscopy; 2005 Feb 01; 102(3):221-6. PubMed ID: 15639353
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  • 34. Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopy.
    Shegaonkar AC, Salapaka SM.
    Rev Sci Instrum; 2007 Oct 01; 78(10):103706. PubMed ID: 17979427
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  • 35. Effect of solution concentration, surface bias and protonation on the dynamic response of amplitude-modulated atomic force microscopy in water.
    Wu Y, Gupta C, Shannon MA.
    Langmuir; 2008 Oct 07; 24(19):10817-24. PubMed ID: 18763814
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  • 39. Contrast formation in Kelvin probe force microscopy of single π-conjugated molecules.
    Schuler B, Liu SX, Geng Y, Decurtins S, Meyer G, Gross L.
    Nano Lett; 2014 Jun 11; 14(6):3342-6. PubMed ID: 24849457
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