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Journal Abstract Search

161 related items for PubMed ID: 20511216

  • 1.
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  • 2. Electron beam coherence measurements using diffracted beam interferometry/holography.
    Herring RA.
    J Electron Microsc (Tokyo); 2009 Jun; 58(3):213-21. PubMed ID: 19141592
    [Abstract] [Full Text] [Related]

  • 3. Coherence of k-space electrons: application to TDS electrons by DBI.
    Herring RA.
    Microscopy (Oxf); 2013 Jun; 62 Suppl 1():S99-108. PubMed ID: 23536697
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  • 6. A fully coherent electron beam from a noble-metal covered W(111) single-atom emitter.
    Chang CC, Kuo HS, Hwang IS, Tsong TT.
    Nanotechnology; 2009 Mar 18; 20(11):115401. PubMed ID: 19420438
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  • 7. Twin-electron biprism.
    Ikeda M, Sugawara A, Harada K.
    J Electron Microsc (Tokyo); 2011 Dec 18; 60(6):353-8. PubMed ID: 22003228
    [Abstract] [Full Text] [Related]

  • 8. Energy-filtered electron-diffracted beam holography.
    Herring RA.
    Ultramicroscopy; 2005 Oct 18; 104(3-4):261-70. PubMed ID: 15996821
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  • 10. Measurement of spatial coherence of electron beams by using a small selected-area aperture.
    Morishita S, Yamasaki J, Tanaka N.
    Ultramicroscopy; 2013 Jun 18; 129():10-7. PubMed ID: 23545433
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  • 13. Reconstruction technique for off-axis electron holography using coarse fringes.
    Fujita T, Yamamoto K, McCartney MR, Smith DJ.
    Ultramicroscopy; 2006 Apr 18; 106(6):486-91. PubMed ID: 16515836
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  • 14. Linear versus non-linear structural information limit in high-resolution transmission electron microscopy.
    Van Aert S, Chen JH, Van Dyck D.
    Ultramicroscopy; 2010 Oct 18; 110(11):1404-10. PubMed ID: 20655146
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  • 16. Diffracted beam interferometry - Differential phase contrast image of an amorphous thin film material.
    Herring RA.
    Micron; 2022 Sep 18; 160():103317. PubMed ID: 35753170
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  • 17. First combined electron backscatter diffraction and transmission electron microscopy study of grain boundary structure of deformed quartzite.
    Shigematsu N, Prior DJ, Wheeler J.
    J Microsc; 2006 Dec 18; 224(Pt 3):306-21. PubMed ID: 17210063
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  • 19. Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel.
    Mitchell DR.
    J Microsc; 2006 Nov 18; 224(Pt 2):187-96. PubMed ID: 17204066
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  • 20. The Fresnel effect of a defocused biprism on the fringes in inelastic holography.
    Verbeeck J, Bertoni G, Schattschneider P.
    Ultramicroscopy; 2008 Feb 18; 108(3):263-9. PubMed ID: 18036742
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