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Journal Abstract Search

234 related items for PubMed ID: 21233549

  • 1. Force gradient sensitive detection in lift-mode Kelvin probe force microscopy.
    Ziegler D, Stemmer A.
    Nanotechnology; 2011 Feb 18; 22(7):075501. PubMed ID: 21233549
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  • 7. Atomic contact potential variations of Si(111)-7 x 7 analyzed by Kelvin probe force microscopy.
    Kawai S, Glatzel T, Hug HJ, Meyer E.
    Nanotechnology; 2010 Jun 18; 21(24):245704. PubMed ID: 20484786
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  • 8. On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy.
    Nony L, Bocquet F, Loppacher C, Glatzel T.
    Nanotechnology; 2009 Jul 01; 20(26):264014. PubMed ID: 19509441
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  • 9. Quantitative 3D-KPFM imaging with simultaneous electrostatic force and force gradient detection.
    Collins L, Okatan MB, Li Q, Kravenchenko II, Lavrik NV, Kalinin SV, Rodriguez BJ, Jesse S.
    Nanotechnology; 2015 May 01; 26(17):175707. PubMed ID: 25851168
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  • 10. Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.
    Wagner T, Beyer H, Reissner P, Mensch P, Riel H, Gotsmann B, Stemmer A.
    Beilstein J Nanotechnol; 2015 May 01; 6():2193-206. PubMed ID: 26734511
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  • 13. Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.
    Giessibl FJ.
    Science; 1995 Jan 06; 267(5194):68-71. PubMed ID: 17840059
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  • 15. Reconstruction of surface potential from Kelvin probe force microscopy images.
    Cohen G, Halpern E, Nanayakkara SU, Luther JM, Held C, Bennewitz R, Boag A, Rosenwaks Y.
    Nanotechnology; 2013 Jul 26; 24(29):295702. PubMed ID: 23807266
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  • 17. Tip-to-sample distance dependence of an electrostatic force in KFM measurements.
    Takahashi T, Ono S.
    Ultramicroscopy; 2004 Aug 26; 100(3-4):287-92. PubMed ID: 15231321
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  • 18. Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy.
    Palleau E, Ressier L, Borowik Ł, Mélin T.
    Nanotechnology; 2010 Jun 04; 21(22):225706. PubMed ID: 20453285
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  • 19. Excluding Contact Electrification in Surface Potential Measurement Using Kelvin Probe Force Microscopy.
    Li S, Zhou Y, Zi Y, Zhang G, Wang ZL.
    ACS Nano; 2016 Feb 23; 10(2):2528-35. PubMed ID: 26824304
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  • 20. The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes.
    Ma ZM, Kou L, Naitoh Y, Li YJ, Sugawara Y.
    Nanotechnology; 2013 Jun 07; 24(22):225701. PubMed ID: 23633495
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